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Sample dielectric water problem

An alternative solution to the dielectric water problem that applies in particular to standard TE102 rectangular resonators, is to use a flat cell a rectangular sample holder that is oversized in the vertical direction, and with one small cut-through dimension, say 1 mm, and the other dimension circa 10 mm, that is, approaching the bore of the cavity access holes (Figure 3.11). When in place in the resonator, this cell is rotated about its vertical axis to a position such that the 10 mm dimension points to a direction of minimal /i-field. [Pg.51]

AFM can be run in three different modes contact, noncontact, and tapping mode. When AFM is in the contact mode (similar to stylus profilometry), the most common problem encountered is that under ambient conditions, sample surfaces are covered by a layer of adsorbed gases consisting primarily of water vapor and nitrogen. In addition, a dielectric film can trap electrostatic charge, which can contribute to additional attractive forces between probe and sample. These problems may cause friction in probing, which will destroy the sample or distort the resulting data. [Pg.237]


See other pages where Sample dielectric water problem is mentioned: [Pg.29]    [Pg.51]    [Pg.21]    [Pg.2]    [Pg.100]    [Pg.29]    [Pg.616]    [Pg.587]    [Pg.74]    [Pg.286]    [Pg.322]    [Pg.298]    [Pg.205]    [Pg.239]    [Pg.325]    [Pg.336]    [Pg.151]   
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