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Rutherford backscattering quantitative elemental surface

Within the last 5—10 years PIXE, using protons and helium ions, has matured into a well-developed analysis technique with a variety of modes of operation. PIXE can provide quantitative, nondestructive, and fast analysis of essentially all elements. It is an ideal complement to other techniques (e.g., Rutherford backscattering) that are based on the spectroscopy of particles emitted during the interaction of MeV ion beams with the surface regions of materials, because... [Pg.367]

See other pages where Rutherford backscattering quantitative elemental surface is mentioned: [Pg.309]    [Pg.1828]    [Pg.36]    [Pg.311]    [Pg.476]    [Pg.502]    [Pg.224]    [Pg.207]    [Pg.302]    [Pg.83]    [Pg.309]    [Pg.1828]    [Pg.81]    [Pg.445]   


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Backscatter

Backscattered

Rutherford

Rutherford backscattering

Surface element

Surfaces backscattering

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