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Root-mean-square height

Fundamental frequency of the resonator Correlation function for surface roughness Root mean square height of a roughness Wave vector of shear waves in quartz, (Uy pq//rq Correlation length of surface roughness Thickness of the liquid film Thickness of interfacial layer Molecular dynamics Pressure in a liquid Quartz crystal microbalance Hydrodynamic roughness factor Electrochemical roughness factor Coordinates (normal and lateral)... [Pg.112]

This impHes that the corresponding root-mean-square height of the surface, rr, is much less than the wavelength of tight. [Pg.85]

Fig. 7a, b. PMIM-image of (a) a poly-p-bromostyrene surface [118], (b) a PS/polybutadiene diblock copolymer, PS-b-PB, at approximately 100 fold magnification. The lateral resolution is of the order of 1 pm while the height resolution is of the order of 0.6 nm. The root-mean-square roughness averaged over the area shown is 0.8 nm in (a) close to the resolution limit of the technique. It is much larger (10 nm) in (b) due to the formation of steps after annealing. The scale in z-direction in (a) and (b) is different by a factor of 7... [Pg.383]

Figure 20 AFM image (tapping mode, height image) of a dry cellulose film. The cellulose concentration was 0.5%w/w. The root-mean-square surface roughness was 5.0 nm (courtesy of M. Liu, University of Birmingham, UK). Figure 20 AFM image (tapping mode, height image) of a dry cellulose film. The cellulose concentration was 0.5%w/w. The root-mean-square surface roughness was 5.0 nm (courtesy of M. Liu, University of Birmingham, UK).
S/N = (maximum peak height)/(root-mean-square of noise) (10.2)... [Pg.381]

Figure 11.5. Comparison of the mean (left) root mean square (right) velocity profiles for TCI (4 processors) and TC2 (8 processors) simulations over half channel height. Figure 11.5. Comparison of the mean (left) root mean square (right) velocity profiles for TCI (4 processors) and TC2 (8 processors) simulations over half channel height.
Average surface roughness defined as root mean square of the height distribution of an area. [Pg.329]

Real surfaces are covered with asperities. The texture of a surface is complicated, and many parameters are used to quantify the various surface characteristics. This practice is common in microelectronic industries. There are three primary methods of numerically representing surface roughness centerline average (Rc), root-mean-square (Rq), and maximum peak-to-valley height (Rt). These are defined as ... [Pg.48]

The root-mean-square (RMS) representation of a specific height (Rq) is ... [Pg.48]

Figure 12-5. Center-line average and root-mean-square surface roughness, cencer-line average peak height is given by Ul dl... Figure 12-5. Center-line average and root-mean-square surface roughness, cencer-line average peak height is given by Ul dl...
The second term in the last member of (3.43) gives the Bragg diffraction peaks. The fact that Zo(s) is simply multiplied by P (s) 2 means that the widths of the diffraction peaks are not broadened, and only their heights are modified. A good approximation to p(r) is a Gaussian function, given in (1.102), with a representing the root-mean-square displacement of atoms about their mean positions. In such a case, P (s) 2 can be represented by... [Pg.109]

Complete results are shown in Table II. Column 2 lists the speed Columns 3 and 4 show the results of the fitting technique described above. Columns 5 and 6 indicate the interfacial compositions, Column 7 lists the root-mean square difference between calculated and experimentally measured heights, and the final column lists the e values for each run. [Pg.283]


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See also in sourсe #XX -- [ Pg.2 , Pg.5 ]




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Root mean squar

Root mean squared

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