Reflection by mirror

Figure Bl.7.17. (a) Schematic diagram of a single acceleration zone time-of-flight mass spectrometer, (b) Schematic diagram showing the time focusing of ions with different initial velocities (and hence initial kinetic energies) onto the detector by the use of a reflecting ion mirror, (c) Wiley-McLaren type two stage acceleration zone time-of-flight mass spectrometer.

This instrument was laid in a vacuum desiccator with the fiber vertical. A flashlight bulb was set up outside the desiccator, and the position of the spot of light reflected by the meter mirror was observed on a piece of tissue paper pasted to the desiccator wall. The experimental results given in Table I were obtained. 

To further corroborate these potentiometric results, we again used optical second harmonic generation (SHG). The SHG measurement system was essentially the same as used in the study described in Section II, except the laser beam was first reflected by a mirror and then totally reflected by the liquid-liquid interface. 

Nanobeam optics with beam diameters of several nanometers are presently developed at the ESRF. Using a Kirkpatrick-Baez optical system (cf. Fig. 4.9) beam diameters of 80 nm have been achieved. The Kirkpatrick-Baez system is made from two successively reflecting, orthogonal mirrors that are bent into elliptical shape by mechanical benders. The focused flux is strongly increased by deposition of a graded multilayer structure similar to that used with the parabolic Gobel mirror. 

Figure 1. Schematic diagram of specially designed fixtures used to measure, in situ, the evolving rheological properties during UV curing. The sample is placed between the two quartz plates and the incident UV radiation exiting the liquid light guide is reflected by the mirror through the plates and onto the sample.

The mass accuracy and resolution of TOF analyzers was improved by the reflectron design in which traveling ions are reflected by an ion mirror and are turned around in their flight paths. 

In some situations measurement of the reflected, rather than the transmitted, radiation may be made to assess the amount of radiation that has been absorbed by the sample. There are two main ways by which radiation might be reflected. Specular reflection is similar to the reflection by a mirror and, for quantitative work, the angles of the incident and the reflected radiation are important. Diffuse reflection is from within the layers of the material and the reflected light is disbursed over a range of 180°. This type of reflection is measured in the thin films used in dry chemistry systems. The term reflectance density is often used, which is defined in a manner comparable to absorbance the logarithm of the ratio of incident to reflected light. 

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