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Raman microscopy apparatus

Figure Bl.2.12. Schematic diagram of apparatus for confocal Raman microscopy. From [3], used with penuission. Figure Bl.2.12. Schematic diagram of apparatus for confocal Raman microscopy. From [3], used with penuission.
Abstract Surface analyses have been one of the key technologies for corrosion control and surface finishing. It is very important that the most appropriate apparatus for the purpose of the analyses should be selected from various analytical techniques. In this chapter, surface analytical methods for corrosion control and surface finishing, such as X-ray fluorescence analysis (XRF), X-ray diffraction analysis (XRD), X-ray photo-electron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), Rutherford back-scattering spectrometry (RBS), Surface-enhanced Raman spectroscopy (SERS), Fourier-transform infrared spectroscopy (FTIR), and so on, are briefly introduced. [Pg.47]

See other pages where Raman microscopy apparatus is mentioned: [Pg.605]    [Pg.129]    [Pg.605]    [Pg.768]    [Pg.920]    [Pg.920]    [Pg.655]    [Pg.1662]   
See also in sourсe #XX -- [ Pg.52 , Pg.53 ]



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Raman microscopy

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