Primary analytical wavelength

Analyte Primary analytical wavelength (nm) Alternate analytical wavelength (nm) Decreased sensitivity factor... 

Recent studies on iron sulfide minerals in coals, minerals in coals, and in situ investigation of minerals in coal all used the scanning electron microscope (SEM) as the primary analytical tool. The ion microprobe mass analyzer (IMMA) is more sensitive than either the energy-dispersive x-ray spectrometer or the wavelength-dispersive x-ray spectrometer, both of which are used as accessories to an electron microscope. 

Fig. 7—2. Spectral data to illustrate absorption and enhancement effects for three transition elements. (To avoid crowding, only part of the cobalt absorption curve is shown.) See Table 7-1. Case B. Substitution of A1 for Fe decreases absorption of incident beam and has little effect on analytical line. Net positive absorption effect. Case C. Substitution of Pb for Fe decreases absorption of primary beam but greatly increases absorption of analytical line. Net negative absorption effect. Case D. Note wavelength relationship indicated in figure. Enhancement impossible. Case E. Note wavelength relationship in figure. Enhancement occurs.

An integral part of a fibre optic sensor is the light source. Its primary task is to deliver an appropriate light, which possesses such features as an optical power suitable to interact with an analyte or an indicator from the optrode, a wavelength matched to the spectral properties of the sensors in order to obtain the highest sensitivity, and, in dependence on the construction of the sensor, polarisation, short pulse etc. There are many various light sources utilised in the fibre optic chemical sensors. They differ in spectral properties, generated optical power and coherence. 

This chapter discusses the range of analytical methods which use the properties of X-rays to identify composition. The methods fall into two distinct groups those which study X-rays produced by the atoms to chemically identify the elements present, and X-ray diffraction (XRD), which uses X-rays of known wavelengths to determine the spacing in crystalline structures and therefore identify chemical compounds. The first group includes a variety of methods to identify the elements present, all of which examine the X-rays produced when vacancies in the inner electron shells are filled. These methods vary in how the primary vacancies in the inner electron shell are created. X-ray fluorescence (XRF) uses an X-ray beam to create inner shell vacancies analytical electron microscopy uses electrons, and particle (or proton) induced X-ray emission (PIXE) uses a proton beam. More detailed information on the techniques described here can be found in Ewing (1985, 1997) and Fifield and Kealey (2000). 

Spectral interferences are due to substances in the flame that absorb the same wavelength as the analyte, causing the absorbance measurement to be high. The interfering substance is rarely an element, however, because it is rare for another element to have a spectral line at exactly the same wavelength, or near the same wavelength, as the primary line of the analyte. However, if such an interference is suspected, the analyst can tune the monochromator to a secondary line of the analyte to solve the problem. 

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