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Presentation fractional

Table 4 presents fractions of sunk, suspended, and floating material after a single separation. The residual grain represents grain that was hand sorted from either the suspended or floating material. The DM in the effluent was obtained by mass balance after other components had been dried and separated. [Pg.48]

Figures 2a and b presents fractional conversion F versus reduced time Fo kinetic curves for favorable (variants I through Ill(a) and 1.2 through 1.6(b)) exchange isotherms. Figures 2a and b presents fractional conversion F versus reduced time Fo kinetic curves for favorable (variants I through Ill(a) and 1.2 through 1.6(b)) exchange isotherms.
As we did in Example 26-3, we determine the specific rate constant k from the known half-life. The time required to reach the present fraction of the original activity is then calculated from the first-order decay equation. [Pg.1018]

ST = saturation threshold expressed as fraction of the kerogen present, fraction. [Pg.388]

Present fractionation of U/Th in the mantle can be studied by comparing ATth with K , values in Table 3. K, ratios are generally higher (Stromboli oceanic islands and ridges), but can be lower (Vulcano, Vulcanello, Lipari Vesuvius Etna) than the corresponding A n, ratios. Fig. 3 is a plot of ( Th/ U) versus FejOj/FeO ratios for some very young volcanics. It should be remembered that ( °Th/ U) = so if the... [Pg.8]

In one half life, 50 of saturated activity is produced. As the exposure is continued, the activity builds up more and more slowly. With each T2, it increases half the the remaining value between the present fraction of equilibrium and the final, steady state activity the mirror of decay,... [Pg.102]

The heterogeneous and silicon etching reactions entered into a boimdary conditions at the wafer. The latter were written as a balance of mass flows for each component. The presented fractions of silicon surface covered by CF2, CFs are very important parameters because they are used in the boundary conditions and the etching rate. For example, the local spontaneous etching rate in A/min was defined by the formula ... [Pg.47]

The solvent components usually have a low mutual solubility and are present in reasonably large mole fractions in the system. If solvents are not so designated, we take as the "solvent components" those two components, present in significant mole fraction in the system, that have the lowest binary solubilities. ... [Pg.124]

Present in coal tar (i%), from which it is separated by fractional distillation. Can be... [Pg.36]

Raoult s law When a solute is dissolved in a solvent, the vapour pressure of the latter is lowered proportionally to the mole fraction of solute present. Since the lowering of vapour pressure causes an elevation of the boiling point and a depression of the freezing point, Raoult s law also applies and leads to the conclusion that the elevation of boiling point or depression of freezing point is proportional to the weight of the solute and inversely proportional to its molecular weight. Raoult s law is strictly only applicable to ideal solutions since it assumes that there is no chemical interaction between the solute and solvent molecules. [Pg.341]

Figure Bl.18.12. Illustration that only light reflected from object points in the focal plane contributes to the image. If the light is reflected from areas below the focal plane, only a small fraction can pass through the pinliole so that light from those areas does not contribute to the image. The pinliole in front of the detector is exaggerated in size for the sake of presentation. Figure Bl.18.12. Illustration that only light reflected from object points in the focal plane contributes to the image. If the light is reflected from areas below the focal plane, only a small fraction can pass through the pinliole so that light from those areas does not contribute to the image. The pinliole in front of the detector is exaggerated in size for the sake of presentation.
One fiirther method for obtaining surface sensitivity in diffraction relies on the presence of two-dimensional superlattices on the surface. As we shall see fiirtlrer below, these correspond to periodicities that are different from those present in the bulk material. As a result, additional diffracted beams occur (often called fractional-order beams), which are uniquely created by and therefore sensitive to this kind of surface structure. XRD, in particular, makes frequent use of this property [4]. Transmission electron diffraction (TED) also has used this property, in conjunction with ultrathin samples to minimize bulk contributions [9]. [Pg.1756]

Methane, CH4, for example, has a central carbon atom bonded to four hydrogen atoms and the shape is a regular tetrahedron with a H—C—H bond angle of 109°28, exactly that calculated. Electrons in a lone pair , a pair of electrons not used in bonding, occupy a larger fraction of space adjacent to their parent atom since they are under the influence of one nucleus, unlike bonding pairs of electrons which are under the influence of two nuclei. Thus, whenever a lone pair is present some distortion of the essential shape occurs. [Pg.38]


See other pages where Presentation fractional is mentioned: [Pg.413]    [Pg.31]    [Pg.213]    [Pg.412]    [Pg.187]    [Pg.649]    [Pg.377]    [Pg.309]    [Pg.11]    [Pg.186]    [Pg.197]    [Pg.413]    [Pg.31]    [Pg.213]    [Pg.412]    [Pg.187]    [Pg.649]    [Pg.377]    [Pg.309]    [Pg.11]    [Pg.186]    [Pg.197]    [Pg.156]    [Pg.164]    [Pg.196]    [Pg.257]    [Pg.264]    [Pg.294]    [Pg.390]    [Pg.10]    [Pg.10]    [Pg.190]    [Pg.216]    [Pg.486]    [Pg.506]    [Pg.118]    [Pg.580]    [Pg.1668]    [Pg.1768]    [Pg.2688]    [Pg.2816]    [Pg.189]    [Pg.19]    [Pg.71]    [Pg.96]    [Pg.101]   
See also in sourсe #XX -- [ Pg.31 , Pg.254 ]




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