Polished sections artifacts

One problem with the crushing of clinker prior to examination is that microcracks seen in polished-section or thin section study are ambiguously interpreted. Microcracks that are not artifacts of sample preparation may, in some investigations, be related to strain caused by thermal stress (Hornain and Regourd, 1980), crystal reorganization, hydration, and expansion. 

The importance of a well-prepared surface should not be underestimated. The author strongly believes that efforts to produce a high-quality polished section or thin section are rewarded by the relative lack of artifacts which can possibly lead the investigator to incorrect interpretations. Phase identifications free of doubt are worth the extra few minutes of preparation time. 

Accurate porosity data can be obtained by means of quantitative image analysis and microscopy, including electronic methods. However, this requires optimum conditions in the preparation of the polished section, in order to prevent or at least minimize common artifacts, such as ... 

Artifacts introduced through sample preparation are common materials these may be bits of facial tissue, wax, epithelial cells, hair, or dried stain, all inadvertently introduced by the microscopist. Detergent residues on so-called precleaned microscope slides and broken glass are common artifacts, as are knife marks and chatter marks from sectioning with a faulty blade, or scratch marks from grinding and polishing. 

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