Pigments SIMS analysis

There are relatively few detailed studies of particulate fillers by surface analysis and space limitations preclude a review. The interested reader is encouraged to study a series of papers by Johansson and co-workers [36-39] that address the characterisation of coated Ti02 pigments. These discuss in considerable detail the relationship between data from XPS, SIMS and X-ray fluorescence as well as relating surface analytical information to other methods of pigment surface characterisation and to pigment behaviour. 

Van den Berg et al. [185] has compiled a database of SIMS spectra of the most common inorganic pigments. ToF-SIMS offers some interesting possibilities for the spatially resolved analysis of (mixtures of) pigments in paint cross sections. However, the specific selectivity of the technique for different pigments needs to be taken into account. A further point of concern is interference with the embedding medium of the paint cross sections (matrix effect). 

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