PHOTON, ELECTRON, AND ION PROBES

A number of reviews can be consulted for an introduction to the fundamentals both theoretical and practical covering XPS. These include Riggs and Parker (2) and the book by Carlson (3). Electron spectroscopy is reviewed in alternate years in the Fundamental Reviews issue of Analytical Chemistry. The last literature review was published in 1980 (4) and this and previous reviews can be consulted for a coverage of all aspects of the literature of XPS. A number of recent symposia have been held on applications of surface analytical methods in various aspects of materials science such as the symposium on characterization of molecular structures of polymers by photon, electron, and ion probes at the March 1980 American Chemical Society meetings in Houston ( 5) and the International Symposium on Physiochemical Aspects of Polymer Surfaces at this meeting as well as the symposium on industrial applications of surface analysis of which this article is a part. Review articles on various applications of XPS in materials science are listed in Table I. 

Dwight, D.W. Fabish, T.J. Thomas, H.R., Photon, Electron, and Ion Probes of Polymer Structure and Properties," ACS Symposium Series 162, American Chemical Society, Washington, D.C., 1981, pp. 1-442. 

Clark DT(1981)In Dwight DW, Fabish TJ (eds) Photons, electrons and ion probes of polymer structure and properties. Am Chem Soc Washington DC, p 255 (ACS Symposium Series 162)... 

Laery, H.J. Campbell, D.S. "ESCA Studies of Polyimide and Modified Polyimide Surfaces" Photon. Electron, and Ion Probes ACS Washington, DC, 1981. 

In Photon, Electron, and Ion Probes of Polymer Structure and Properties Dwight, D., et al. ... 

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