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Perpendicular-detaching

The factors that influence the bubble expansion and the detachment from the surface may be seen in Figure 27.4, which depicts components of forces acting at the edge of an attached bubble. The surface tension of liquid that acts at the edge of the bubble contact base has two components that are dictated by the contact angle 0. The component parallel to the orifice surface is given by ycos0 and the perpendicular component by y sin 0, where y is the surface tension of the liquid. [Pg.561]

The detaching force, f, is the buoyancy of the bubble, which acts vertically upward (perpendicular to the surface under the conditions in consideration). [Pg.563]

Meta-dinitrobenzene has a large dipole moment (p = 4.29 D), very close to that of nitrobenzene, and a quadrupole moment of Q = - -18 a.u. Its parallel and perpendicular polarizabilities are estimated to be 21.2 and 17 A, respectively. From the electrostatic model, the predicted electron affinity of mDNB is 105 25 meV, corresponding to a peak in the RET curve at around n = 7. The curve for mDNB (not shown) is very different from the RET curve corresponding to pDNB. The broad peak at = 11-12 is not present and is replaced by a very small peak at = 8, close to the predicted value for the dipole-bound mDNB anion. The anions reported here are not observed to undergo field detachment. Again, this observation is attributed to the coupling of these diffuse states with the ground valence anion state. [Pg.293]

The pull-off test for measuring adhesion is described in ISO4624. Adhesion is assessed by measuring the minimum tensile stress necessary to detach or to rupture the coating in a direction perpendicular to the substrate. The result gives the minimum tensile stress required to break the weakest interface (adhesive failure) or the weakest compound (cohesive failure) of the test assembly. Mixed adhesive-cohesive failure may also occur. [Pg.229]

Figure 12. Various images of wafer 4 at 600 mm/s in the perpendicular direction, (a) Droplet jumping over an unpattemed strip, (b) Detached droplet that snbseqnently travels back toward the meniscus and re-attaches to it. (c) Detached droplet that is flying off the surface. Figure 12. Various images of wafer 4 at 600 mm/s in the perpendicular direction, (a) Droplet jumping over an unpattemed strip, (b) Detached droplet that snbseqnently travels back toward the meniscus and re-attaches to it. (c) Detached droplet that is flying off the surface.
A classification of adhesion according to the changes in the interaction between contiguous bodies in the course of detachment was given by Deryagin on the basis of the analogy between adhesion and friction [7, p. 186]. Friction prevents the tangential displacement of particles, and adhesion prevents the displacement of particles in a direction perpendicular to the surface on which they have been deposited. [Pg.4]

Detachment of Particles. The force acting on an adherent particle in the direction perpendicular to the dust-covered surface determines the magnitude of adhesive interaction. If this force is directed tangential to the surface, we are measuring the static friction in the detachment of particles. Under real conditions, the detaching force may be directed at an angle to the dust-covered surface [30-32]. [Pg.24]

If the detaching force is directed perpendicular to the surface, 3 = 1 and Fdet ad the force is directed tangential to the surface, /3 = 0 and F et Fff. The friction of adherent particles in the absence of any external load is caused by adhesion Fg. = /xFgd (where [x is the coefficient of friction). Then, with p = 0,we find that F et Fad -... [Pg.24]

Let us consider the forces acting on a dust particle being detached from a surface. First, we will make the assumption that we can ignore the forces directed tangential to the dust-covered surface this is equivalent to assuming that the electric field is uniform in the direction perpendicular to the surface. Then, after the particle is detached, it is affected only by electrical and gravitational forces. The height to which the particle z will rise can be determined from the equation of particle motion ... [Pg.234]


See other pages where Perpendicular-detaching is mentioned: [Pg.23]    [Pg.224]    [Pg.133]    [Pg.123]    [Pg.169]    [Pg.174]    [Pg.138]    [Pg.204]    [Pg.447]    [Pg.29]    [Pg.26]    [Pg.78]    [Pg.221]    [Pg.484]    [Pg.81]    [Pg.78]    [Pg.76]    [Pg.385]    [Pg.323]    [Pg.20]    [Pg.193]    [Pg.3]    [Pg.264]    [Pg.292]    [Pg.78]    [Pg.221]    [Pg.309]    [Pg.56]    [Pg.314]    [Pg.368]    [Pg.151]    [Pg.205]    [Pg.419]    [Pg.217]    [Pg.976]    [Pg.1537]    [Pg.261]    [Pg.496]    [Pg.96]    [Pg.75]    [Pg.79]   
See also in sourсe #XX -- [ Pg.45 , Pg.169 , Pg.170 , Pg.171 , Pg.301 , Pg.302 , Pg.357 ]




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