Optical Mode Structure in Thin Film Organic Structures Optimization of Bilayer Geometries

2 Optical Mode Structure in Thin Film Organic Structures. Optimization of Bilayer Geometries 

We employ matrix methods in order to obtain the reflection and transmission coefficient of the electromagnetic field within the device. Stratified structures with isotropic and homogeneous media and parallel-plane interfaces can be described by 2 x 2 matrices because the equations governing the propagation of the electric field are linear and the tangential component of the electric field is continuous [15,16], We consider a plane wave incident from the 

For light with the electric field parallel to the plane of incidence (p-polarized or TM waves), they are defined by 

By using the interface matrix and the layer matrix of (6.1) and (6.5), the total system transfer matrix (scattering matrix) S, which relates the electric field on the ambient and substrate sides by 

When light is incident from the ambient side in the positive x direction, there is no wave propagating in the negative x direction inside the substrate. This means that Em+1 = 0. For the whole layered structure, the resulting complex reflection and transmission coefficients can be expressed by using the matrix elements of the total system transfer matrix of (6.8)  

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