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Multiple-angle incidence resolution

Itoh, Y Kasuya, A. and Hasegawa, T. (2009) Analytical understanding of multiple-angle incidence resolution spectrometry based on classical electromagnetic theory. J. Phys. Chem. A, 113, 7810-7817. [Pg.139]

Brewster angle IR spectroscopic measurement (14) was performed to evaluate the formation of layered structure in the NTS multilayer films. The NTS monolayer was transferred onto double mirror polished silicon wafer substrate. The incident angle of p-polarized infrared beam was 73.7" (the Brewster angle of interface between silicon wafer and air) in order to eliminate the multiple reflection of the infrared beam within the silicon wafer substrate. The spectra were recorded at a resolution of 4 cm" ... [Pg.334]

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Angle incidence

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