Microscopy topography

Transmission electron microscopy (topography local thickness substructure—all thickness ranges) STEM/EDX... 

Figure 4.13 Atomic force microscopy topography of a hybrid sol-gel film. (Reproduced from ref. 21, with permission.)...

Figure 2. Atomic force microscopy topography image of the free surface of a microimprinted SP/PEMA-co-PMA film containing 5 wt% SP. The period of the pattern is 1.3 pm and its depth 520 nm.

Figure 4. Atomic force microscopy topography images of the microimprinted gratings formed on the surfaces of (a) a PPETIA film and (h) a 0.3% SP/PPETIA film using interferometric hthography. The and y axes are presented at different scales.

Scaiming probe microscopies have become the most conspicuous surface analysis tecimiques since their invention in the mid-1980s and the awarding of the 1986 Nobel Prize in Physics [71, 72]- The basic idea behind these tecimiques is to move an extremely fine tip close to a surface and to monitor a signal as a fiinction of the tip s position above the surface. The tip is moved with the use of piezoelectric materials, which can control the position of a tip to a sub-Angstrom accuracy, while a signal is measured that is indicative of the surface topography. These tecimiques are described in detail in section BI.20. 

Scanning electron microscopy (thickness topography porosity barrier layers fracture sections) Energy dispersive X-ray analysis (EDX)... 

X-ray difl raaion (structure grain size preferred orientation stress) Scanning laser microscopy Optical microscopy Oocnl thickness topography nucleation general morphology internal oxidation) l.R. spectroscopy (specialised analysis and applications)... 

Atomic force microscopy (AFM) has become a standard technique for high-resolution imaging of the topography of surfaces. It enables one to see nanoscopic... 

Atomic force microscopy (AFM) has been used to characterize dendrimers that have been adsorbed onto a surface such as silica. AFM involves moving a finely tipped stylus across a surface and monitoring the tip movements as it traces the surface topography. In studying adsorbed dendrimers, samples can be scanned repeatedly and in a variety of directions. When this is done, it is found that all the images are the same. True dendrimers form objects of only one size. 

STM, X-ray reflectivity, and AFM are excellent in situ techniques for studying surface topography and morphology. Scanning electron microscopy is a useful ex situ technique. 

In scanning electrochemical microscopy (SECM) a microelectrode probe (tip) is used to examine solid-liquid and liquid-liquid interfaces. SECM can provide information about the chemical nature, reactivity, and topography of phase boundaries. The earlier SECM experiments employed microdisk metal electrodes as amperometric probes [29]. This limited the applicability of the SECM to studies of processes involving electroactive (i.e., either oxidizable or reducible) species. One can apply SECM to studies of processes involving electroinactive species by using potentiometric tips [36]. However, potentio-metric tips are suitable only for collection mode measurements, whereas the amperometric feedback mode has been used for most quantitative SECM applications. 

Fischer L., Muhlen E.Z., Brummer G.W., Niehus H. Atomic force microscopy investigations of the surface topography of a multidomain porous goethite. European J Soil Sci 1996 47 329-334. 

Nomarski differential in plants with light-stressed foliage Reveals edges in biological microscopy Scanning Surface topography, surface spectroscopy,... 

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