Membranes scanning electron microscopy/energy dispersive

Scanning electron microscopy (SEM) combined with energy dispersive X-ray (EDX) analysis could be used to physico-chemical characterization of SILMs [26]. This technique allows the characterization of the membrane surface morphology and the examination of the global chemical composition of the membranes and the distribution of the ILs within pores. Figure 11.2 shows examples of SEM micrographs of a plain nylon membrane and supported liquid membranes based on [bmim ][PF ] prepared by using the pressure method [26]. 

In this work, we report on the preliminary results from the fabrication and characterization of Ni-AbOs membranes. The effect of sintering temperatures on membrane support was investigated. The fabricated membranes were characterized by X-ray diffractometry (XRD), scanning electron microscopy (SEM), energy dispersive X-ray spectrometer including X-ray mapping (EDS). In addition, the pore size and porosity were determined by Hg porosimetry. 

Investigations of the cross-sectional surface of a CBS electrode were carried out using scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDAX) techniques. A disc of a CBS membrane was conditioned in CaCl2 solution then immersed in liquid nitrogen and broken across a diameter. The broken edge of the membrane was examined by SEM and EDAX (for calcium and chlorine). 

Among these, some of the most frequently used are attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectroscopy. X-ray photoelectron spectroscopy (XPS), static secondary ion mass spectrometry (SSIMS), energy dispersive X-ray spectroscopy (EDS), optical microscopy, laser confocal scanning microscopy (LCSM), scanning electron microscopy (SEM), enviromnental scanning electron microscopy (ESEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), contact angle measurement, and some evaluation methods for the biocompatibility of membrane surfaces. 

Cross section of a ZIF-8 membrane on a macroporous titania support. Left-. Scanning electron microscopy. Rig/it Energy dispersive X-ray spectroscopy (EDXS) in mapping mode, showing the sharp transition between the MOF layer and the support [22]. 

Characterization techniques such as scanning and transmission electron microscopies, infrared absorption measurements. X-ray diffraction experiments, energy dispersive X-ray, and Raman spectrometries show that the as-deposited silicon nanowires are amorphous, composed of pure Si and homogeneous in sizes with average diameters and lengths well matching with the nanopores diameters and the thicknesses of the membranes. Thanks to... 

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