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Mass storage class

Different types of device classes, namely, human interface device (HID) class, test and measurement class (USBTMC), mass storage class (MSC), and USB host capability are available. The designer has to select the appropriate class depending upon his needs. [Pg.307]

Scanned probe microscopies (SPM) that are capable of measuring either current or electrical potential are promising for in situ characterization of nanoscale energy storage cells. Mass transfer, electrical conductivity, and the electrochemical activity of anode and cathode materials can be directly quantified by these techniques. Two examples of this class of SPM are scanning electrochemical microscopy (SECM) and current-sensing atomic force microscopy (CAFM), both of which are commercially available. [Pg.241]

See other pages where Mass storage class is mentioned: [Pg.293] [Pg.1355] [Pg.331] [Pg.379] [Pg.22] [Pg.154] [Pg.331] [Pg.357] [Pg.341] [Pg.46] [Pg.22] [Pg.80] [Pg.278] [Pg.182] [Pg.76] [Pg.2541] [Pg.65] [Pg.131] [Pg.62] [Pg.331] [Pg.348] [Pg.159] [Pg.357] [Pg.497] [Pg.1355] [Pg.177] [Pg.91] [Pg.633] [Pg.67] [Pg.337] [Pg.110] [Pg.1] [Pg.397] [Pg.155] [Pg.250] [Pg.314] [Pg.139] [Pg.1061] [Pg.259] [Pg.123] [Pg.686] [Pg.72] [Pg.3] [Pg.301] [Pg.283] [Pg.363]