Light intensity profiles

Fig. 38. Diagram comparing the optical characteristics of a standard binary chrome mask with a phase-shift mask. The changes in the electric fields introduced by the phase-shift elements result in a sharper light intensity profile at the wafer surface.

Figure 10.8 (a) The light intensity profile used in this experiment and the morphology obtained at low magnification obtained for a PSC/PVME (20/80) blend irradiated at 127°C for 240min. 

Figure 16. Effect of particle aggregation on the back-scattered light intensity profile of food emulsion, containing 20 wt% emulsified fat, at 5 °C (green light).

Jacob SM, Dranoff JS. Light intensity profiles in a perfectly mixed photoreactor. AIChE J 1970 16 359-363. 

Even though one can obtain good agreement between the measured and calculated light intensity profiles for sedimentation equilibrium experiments, this method has drawbacks for the routine assessment of the performance of the optical system. There is not commercially available a standard solute with guaranteed purity and certified sedimentation behavior. Moreover each experiment requires a correction baseline obtained from the cells spun with both sectors filled with solvent. Since a time period of 8 hr or more is required to achieve equilibrium, it becomes a formidible task to investigate the effect of a number of parameters. 

Knowledge of soil surfaces is still very poor, as there is limited information on basic parameters such as light intensity profiles in the soil, extinction coefficients and reaction quantum yields. Because light intensity decreases... 

For a Gaussian distribution of the scattered light intensity profile, the intensity ACF, g(2)(xcorr, 0), is related to the electric field ACF, xcorr, 9), via the Siegert relation ... 

Figure 12.16 CCD images of the DFLC microlens array (right) and the corresponding 3-D light intensity profiles (left) at (a) 0, (b) 50 V nis, (c) 150 V nis, and (d) 200 Vrnis- Fan 2005. Reproduced with permission from IEEE.

Figure 15.6 Scattered light intensity profile of the diffuser for incident light with various incident angles. Reproduced with permission from Wiley.

Figure 5.9a illustrates the focused spot patterns produced by such microlens arrays when no voltage was applied. Arrays of uniform bright spots generated by positive lenses were observed. The light-intensity profile of spot A was measured at different voltages, V = 0, 40, 60 V ms/ respectively (Figure 5.9b). At V = 0, the peak intensity was the strongest. As the applied voltage increased, the LC directors in the polymer cavities reoriented toward the electric field and the curvature of the refractive index profile gradually...

Concentrations of 1 g and 2 g were tested for clay suspensions. In both cases, image processing allowed the determination of a sharp maximum in the light intensity profile and thus the deposit thickness measurement was possible. Higher concentrations will be tested but it currently appears that the LSGI method is well suited to a range of concentrations larger than for other optical techniques. 

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