Lateral force microscopy image

Fig. 13 Comparative study of symmetric and asymmetric electroactive nanoarrays for the study of cell adhesion and polarization (a) DPN was used to pattern a SAM nanospot of hydroquinone-terminated alkanethiolates for subsequent RGD immobilization and cell adhesion, (b) Lateral force microscopy image of a symmetric nanoarmy (left) and fluorescent cell having a diffusive nucleus-centrosome-Golgi vector that indicates no preferential migratory direction (right), (c) Cell polarity vectors orient toward the direction of higher RDG density on asymmetric nanoarrays, (d) Higher magnification of the cell polarization vector (above) and its schematic (below). Reproduced from [37, 38] with permission. Copyright The American Chemical Society, 2008...

For example, chemical contrast images were obtained by lateral force microscopy (LFM) from a topologically flat surface of a self assembled monolayer consisting of chemically different domains. In order to make the chemical adhesion the dominant contribution to the friction signal, the tip was modified by a monolayer with appropriate terminal groups [149-155]. However, since LFM operates in contact mode, the surface deformation is inevitable. 

Lateral force microscopy (LFM) is performed simultaneously with topographical imaging in contact mode using V-shaped Si3N4 cantilevers with a nominal spring constant of 0.06 N/m. All lateral force data are acquired under Milli-Q water. We use the open cell configuration (see Sect. 3.3 in Chap. 3). To ensure meaningful comparisons of friction data acquired on different films, the same tip must be used for all the films tested. 

Constant Height Mode AFM Constant Force Mode AFM Constant Error Mode AFM Lateral Force Microscopy (LFM) Spreading Resistance Imaging... 

Hahner G, Marti A and Spencer N D 1997 The influence of pH on friction between oxide surfaces in electrolytes, studied with lateral force microscopy application as a nanochemical imaging technique Tribol. Lett. 3 359... 

Figure 10.14 Lateral force microscopy (LFM) image of PPY nanopattern written at 0.8gm s . (Reprinted with permission from Advanced Materials, Electrostatically Driven Dip-Pen Nanolithography of Conducting Polymers by J.-H. Lim and C. A. Mirkin, 14, 20, 1474-1477. Copyright (2002) Wiley-VCH)...

Lateral force microscopy (LFM) measures the lateral deflections in the cantilever that are present from forces on the cantilever parallel to the plane of the sample surface. Lateral deflections of the cantilever are normally attributable to changes in surface friction or changes in slope. The LFM has been used to image variation in surface friction which can arise from inhomogeneity in the surface material. 

Monte Carlo simulations (Lai and Binder 1992). Figure 6.11 shows scanning force microscopy images of an end-grafted layer of a water-soluble polymer, dextran, which in water appears as a uniform layer, but, after the addition of a poor solvent, propanol, develops lateral structure (Frazier et al. 1997). As the grafting density is increased yet further the homogeneous, layer structure is expected once again to become stable. 

Figure 3. Images from lateral force microscopy displaying the structure of the gradients at 20 mm from the ends (a, single-component gradient b, two-component gradient (OH-teiminated) c, two-component gradient (COOH-terminated)). Overview images (top, 1 m X 1 pita) and zoomed-in images (below, 0.1 pita x 0.1 pim) are presented. An island-like structure is found in all three images.

---