Joint Committee on Powder Diffraction Standards

Joint Committee on Powder Diffraction Standards (JCPDS), Standard Powder Diffraction File, International Center for Diffraction Data, Swarthmore, PA. 

The XRD spectra for the nonvolatile material produced from the pyrolysis of 7, with the Joint Committee on Powder Diffraction Standards (JCPDS) reference patterns for CuInS2 (27-0159), confirmed it to be single-phase CuInS2 (see Fig. 6.9). Examination of the EDS spectra for the same samples shows predominant emissions from Cu, In, and S edges, with the approximate percentage atomic composition of 27, 23, and 50 for 7 and 28, 23, and 49 for 8, respectively, thus supporting the formation of CuInS2. 

JCPDS Joint committee on powder diffraction standards LB Langmuir-Blodgett... 

Tab. 7.10 X-ray powder diffraction data for iron oxides (if not otherwise stated Joint Committee on Powder Diffraction Standards)... 

Aust. J. Soil Res. 16 215-227 Joint Committee on Powder Diffraction Standards Mineral powder diffraction fde. Data book. Published by the JCPDS International Centre for Diffraction Data, Swarfhmore, Pennsylvania, U SA, pp. 942 Jolivet, J.P. Tronc, E. (1988) Interfadal electron transfer in colloidal spinel iron oxide. Conversion of Fe304 to y- Fe203 in aqueous medium. J. Colloid Interface Sci. 125 688—... 

The primary source of x-ray crystal diffract-tion reference data is the above-mentioned ASTM Powder Diffraction File , published by the Joint Committee on Powder Diffraction Standards. This file consists of over 38000 diffraction patterns of crystalline materials including expls and related materials. Scientists in the expls field routinely utilize this source. for the identification of expls and metastable phases by comparing the interplanar d spacings and intensities of exptl phases with those of known phases (Refs 4,10,21 22)... 

Powder X-ray diffraction (XRD) patterns of the catalysts were obtained using a Philips APD X-ray diffraction spectrometer equipped with a Cu anode and Ni filter operated at 40 kV and 20 mA (CuKa = 0.15418 nm). Iron phases were identified by comparing diffraction patterns of the catalyst samples with those in the standard powder XRD file compiled by the Joint Committee on Powder Diffraction Standards published by the International Center for Diffraction Data. 

The 100 x 325 mesh granules of Catapal SB Alumina used gave an x-ray pattern in excellent agreement with JCPDS (Joint Committee on Powder Diffraction Standards) pattern No. 21-1307 for A100H (boehmite) minor amounts of A1(0H), (nordstrandite with possible gibbsite polymorphs) are also, present- After steam-aging (760°C/5h) this alumina had a mercury surface area of 118 nr/9 and pore volume of 0.98 cc/g. 

Joint Committee on Powder Diffraction Standards files No.06-0696. 

DTA = differential thermal analysis FCC = face centered cubic FWHM = full width at half maximum ICDD = international center for diffraction data JCPDS = joint committee on powder diffraction standards EP = Lorentz and polarization PO = Preferred orientation. PT = parallel tempering PXRD = powder X-ray diffraction SA = simulated annealing SWE = short-wavelength-limit TGA = thermogravametric analysis XRPD = X-ray powder diffraction XRD = X-ray diffraction ... 

Over 250,000 x-ray diffraction patterns have been compiled in a library by the Joint Committee on Powder Diffraction Standards (JCPDS). Figure 14.2 shows the Powder Diffraction File (PDF) for hexamethylbenzene. The crystallographic information includes a literature reference, cell parameters, space gronp, volume of unit cell, density, intensity pattern, and identification of the diffraction... 

Mighell, A. D. and Stalick, J. K. (1983). Crystal data. Determinative tables. Vol. 6, 3rd edn. U. S. National Institute of Science and Technology, JCPDS—Joint Committee on Powder Diffraction Standards, ICDD—International Centre for Diffraction Data. [14]... 

J. D. H. Donnay and H. M. Ondik, "Crystal Data, Determinative Tables," 3rd edition, Vol. 2, Nat. Bur. Stand, and Joint Committee on Powder Diffraction Standards, 1973. 

The typical X-ray spectrum is a plot of intensity verses angle, e.g., 25. The phase can be indentifled by comparing the spectrum to the Powder Diffraction File compiled by the international Center for Diffraction Data, formerly known as Joint Committee on Powder Diffraction Standards. 

Joint Committee on Powder Diffraction Standards, Data Cards 25-138, 24-1035. 20-187, 11-646, 1-0382, 28-739, 11-647. 1-0403. 5-0577. 13-519, 16-479, 27-1403, 21-816, compiled by the International Centre for Diffraction Data, Swarthmore, PA, dates vary. 

Over 150,000 unique powder diffraction data sets have been collected from organic, organometallic, inorganic and mineral samples. These have been compiled into a database known as the JCPDS (Joint Committee on Powder Diffraction Standards). The experimental diffraction data can be cross-matched by on-line search or by comparing the three most intense reflections. This methodology is used as a quick method for the identification of impure materials, and it is also used widely in industry, e.g. for quality control in drug samples or the partition of minerals in clays. 

X-Ray Diffraction techniques are frequently used for identification of the chalcogenide semiconductor structure. The simplest way of doing this is the direct comparison of the powder diffraction patterns with referenced X-Ray Powder Data File published by the Joint Committee on Powder Diffraction Standards (J.C.P.D.S.). The comparison of the observed intensities of the reflections with those of standard... 

Robie, R.A., Bethke, EM., and Beardsley, K.M., U. S. Geological Survey Bulletin 1248, U. S. Government Printing Office, Washington, D.C. Donnay, J.D.H., and Ondik, H.M., Crystal Data Determinative Tables, Third Edition, Volume 2, Inorganic Compounds, Joint Committee on Powder Diffraction Standards, Swarthmore, PA, 1973. 

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