JCPDS Joint Diffraction Standards

Joint Committee on Powder Diffraction Standards (JCPDS), Standard Powder Diffraction File, International Center for Diffraction Data, Swarthmore, PA. 

The XRD spectra for the nonvolatile material produced from the pyrolysis of 7, with the Joint Committee on Powder Diffraction Standards (JCPDS) reference patterns for CuInS2 (27-0159), confirmed it to be single-phase CuInS2 (see Fig. 6.9). Examination of the EDS spectra for the same samples shows predominant emissions from Cu, In, and S edges, with the approximate percentage atomic composition of 27, 23, and 50 for 7 and 28, 23, and 49 for 8, respectively, thus supporting the formation of CuInS2. 

JCPDS Joint committee on powder diffraction standards LB Langmuir-Blodgett... 

Aust. J. Soil Res. 16 215-227 Joint Committee on Powder Diffraction Standards Mineral powder diffraction fde. Data book. Published by the JCPDS International Centre for Diffraction Data, Swarfhmore, Pennsylvania, U SA, pp. 942 Jolivet, J.P. Tronc, E. (1988) Interfadal electron transfer in colloidal spinel iron oxide. Conversion of Fe304 to y- Fe203 in aqueous medium. J. Colloid Interface Sci. 125 688—... 

Detector, with active length = 2.122 °, was used. 0/20 scans were reorded from 4 to 70 0 20 (step size=0.017° time=50 s per step). The evaluation of crystalline phases was carried out using the DIFFRACT/AT program by Siemens, which includes the Joint Committee of Powder Diffraction Standards (JCPDS) data bank. 

The 100 x 325 mesh granules of Catapal SB Alumina used gave an x-ray pattern in excellent agreement with JCPDS (Joint Committee on Powder Diffraction Standards) pattern No. 21-1307 for A100H (boehmite) minor amounts of A1(0H), (nordstrandite with possible gibbsite polymorphs) are also, present- After steam-aging (760°C/5h) this alumina had a mercury surface area of 118 nr/9 and pore volume of 0.98 cc/g. 

DTA = differential thermal analysis FCC = face centered cubic FWHM = full width at half maximum ICDD = international center for diffraction data JCPDS = joint committee on powder diffraction standards EP = Lorentz and polarization PO = Preferred orientation. PT = parallel tempering PXRD = powder X-ray diffraction SA = simulated annealing SWE = short-wavelength-limit TGA = thermogravametric analysis XRPD = X-ray powder diffraction XRD = X-ray diffraction ... 

Over 250,000 x-ray diffraction patterns have been compiled in a library by the Joint Committee on Powder Diffraction Standards (JCPDS). Figure 14.2 shows the Powder Diffraction File (PDF) for hexamethylbenzene. The crystallographic information includes a literature reference, cell parameters, space gronp, volume of unit cell, density, intensity pattern, and identification of the diffraction... 

Mighell, A. D. and Stalick, J. K. (1983). Crystal data. Determinative tables. Vol. 6, 3rd edn. U. S. National Institute of Science and Technology, JCPDS—Joint Committee on Powder Diffraction Standards, ICDD—International Centre for Diffraction Data. [14]... 

Fig. 14-1 Standard 3 x 5 in. JCPDS diffraction data card (card 628 from Set 5) for sodium chloride. Appearing on the card are 1 (file number), 2 (three strongest lines), 3 (lowest-angle line), 4 (chemical formula and name of substance), 5 (data on diffraction method used), 6 (crystallographic data), 7 (optical and other data), 8 (data on specimen), and 9 (diffraction pattern). Intensities are expressed as percentages of Ii, the intensity of the strongest line on the pattern. Most cards have a symbol in the upper right comer indicating the quality of the data (high quality), i (lines indexed, intensities fairly reliable), c (calculated pattern), and o (low reliability). (Courtesy of Joint Conunittee on Powder Diffraction Standards.)...

Over 150,000 unique powder diffraction data sets have been collected from organic, organometallic, inorganic and mineral samples. These have been compiled into a database known as the JCPDS (Joint Committee on Powder Diffraction Standards). The experimental diffraction data can be cross-matched by on-line search or by comparing the three most intense reflections. This methodology is used as a quick method for the identification of impure materials, and it is also used widely in industry, e.g. for quality control in drug samples or the partition of minerals in clays. 

JCPDS PDF cards No. 29-713 and 81-0464 for a-FeOOH, cards No.86-2267, 74-2081 and 10-0325 for NiFc204 International Centre for Diffraction Data, Joint Committee on Powder Diffraction Standards, Powder Diffraction File, 1601 Park Fane, Swarthmore, PA 19081, USA. 

The crystal data are given as follows in the first column, crystal system, space group, Z (number of structural formula units in the unit cell), the calculated density, Dx, and observed density. Dm, in the second column the lattice parameters, a, b, c in A, and a, jS, y, and in the third column the source of the material, reference, and the card number of JCPDS (Joint Committee for Powder Diffraction Standards). The entries AP and ID indicate the tables for the atomic parameters and interatomic distances, respectively. 

Joint Committee for Powder Diffraction Standards, JCPDS card No. 501089, No. 371484 (Joint Committee for Powder Diffraction Standards, Swarthmore, Pennsylvania). 

Phases in the as synthesized powders were identified using an X-ray diffractometer (CuKo, Shimadzu XRD 6000 diffractometer). All measurement were performed at room temperature with the range of 20=25-55°C at 2°C/min scan speed. All samples were analyzed by referring to standards of the Joint Committee of Powder Diffraction Standards (JCPDS) card number, 09-0432 [24]. 

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