Ionic crystals, scanning electrochemical

A highly significant recent development is the integration of atomic force microscopy with SECM (AFM-SECM) [220]. Further details are described in Chapter 3.2 of this volume. An etched Pt wire was flattened and then insulated with electrophoretic paint. This probe acts as the cantilever in AFM and as the SECM tip providing dual force-sensing and electrochemical capabilities. Submicron resolution for SECM and for topography by AEM was achieved for test samples of track-etched polycarbonate membranes and ionic crystal surfaces. As the resolution of the technique improves and it is combined with other scanning probes, it seems likely that SECM can be applied in an ever-wider spectrum of scientific fields. [Pg.485]

Macpherson, J. V., Unwin, P. R. Oscillatory dissolution of an ionic single crystal surface observed with the scanning electrochemical microscope. J. Phys. Chem. 1994, 98,11764. [Pg.450]

BASIL CIS CV CVD DSSC ECALE EC-STM EDX, EDS, EDAX EIS EMF EQCM FAB MS FFG-NMR Biphasic Acid Scavenging Utilizing Ionic Liquids Copper-indium-selenide Cyclic Voltammetry Chemical Vapor Deposition Dye Sensitized Solar Cell Electrochemical Atomic Layer Epitaxy Electrochemical in situ scanning tunnelling microscopy Energy Dispersive X-ray analysis Electrochemical Impedance Spectroscopy Electromotive Force Electrochemical Quarz Crystal Microbalance Fast atom bombardment mass spectroscopy Fixed Field Gradient Nuclear Magnetic Resonance... [Pg.1]