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Capacitance inversion layer

When Uq3 > Up the MOSEET conducts. The conduction current is deterrnined by 1 where Q is the amount of charge in the inversion layer and t is the transit time for electrons to travel from source to drain. Q = C LW (U g — Up) where C = is the gate oxide capacitance per unit area... [Pg.352]

The idea in these papers67,223,224 was to identify the potential of the capacitance minimum in dilute electrolyte solutions with the actual value of Ea=o (i.e., <7ge0m( min) = Ofor the whole surface) and to obtain the value of R as the inverse slope of the Parsons-Zobel plot at min.72 Extrapolation of Cwom vs- to Cgg0m = 0 provides the inner-layer capacitance in the / C geom, and not C ea as assumed in several papers.67,68,223,224 In the absence of ion-specific adsorption and for ideally smooth surfaces, these plots are expected to be linear with unit slope. However, data for Hg and single-crystal face electrodes have shown that the test is somewhat more complicated.63,74,219,247-249 More specifically,247,248 PZ plots for Hg/... [Pg.46]

The space charge layer capacitance is inversely proportional to the width of the depletion layer w. As the width of the depletion layer approaches zero the capacitance approaches infinity, hence... [Pg.139]

As seen in Figure 7, the effect of light on the system is to further increase the capacitance in the inversion layer. This, of course, enhances the unpinning effect as the capacitance of the space-charge-layer approaches or exceeds that of the Helmholtz 1ayer. [Pg.265]

Figure 3. Inverse of the inner-layer capacitance of some jp-metal-water interfaces as a function of surface charge (atomic units) as deduced from experimental data. From Ref. 29 by permission. Figure 3. Inverse of the inner-layer capacitance of some jp-metal-water interfaces as a function of surface charge (atomic units) as deduced from experimental data. From Ref. 29 by permission.
Si(lll) structures formed on n- and p-doped substrates showing the typical accumulation (acc), depletion (dep) and inversion (inv) regimes, (b) Capacitance-voltage curves (1MHz) in the dark (circles) and under white illumination (squares) for a structure formed on a p-doped substrate. The increase in capacitance under illumination in positive bias is characteristic of the formation of an inversion layer. Reprinted from [25]. [Pg.316]

In the circuit, Rs is the electrolyte resistance, CPE indicates the double-layer capacitance, Rc, is the methanol oxidation charge-transfer resistance, while R1 and Cl are the mass transfer related resistance and capacitance (mainly due to methanol adsorption or CO coverage). The physical expression of these parameters can be deduced from the reaction kinetics. In the methanol oxidation reaction, the overall charge transfer rate is the sum of each charge-transfer step (rct). The Faradaic resistance (Rj) equals the inverse of the DC polarization curve slope ... [Pg.323]

There are several complications in using this technique for a-Si H, first of which is the frequency dependence. The capacitance is measured by the response to a small alternating applied electric field. The depletion layer capacitance is obtained only when the free carriers within the bulk of the semiconductor can respond at the frequency of the applied field, dielectric relaxation time. [Pg.115]

The capacitances for the accumulation layer and inversion layer are respectively given by... [Pg.12]

The inverse boundary capacitance Q is essentially the sum of the inverse contribution of the space charge layer and the rigid double layer and usually dominated by the first contribution. Since the effective dielectric permeabilities of bulk and boundary are comparable, the ratio cjc. significantly differs from unity (it is typically of the order of LIX, L being the sample thickness, and X the Debye length). This explains (i) why for comparable and values the relaxation times are typically drastically different, and (ii) why the uncertainty whether Q is in parallel to the whole MX-part of the cell or only to the proper bulk part as assumed in Eq. (62), corresponds to a quantite negligeable. Note that in a polycrystalline material 1/Q as well as are—if they... [Pg.79]

An alternative and the most commonly used way to verify the Grahame model is based on Parsons-Zobel (PZ) plots [37], in which the inverse values of the experimentally measured capacitance, are shown as a function of the inverse diffuse-layer capacitance given by Eq. (21a). The... [Pg.48]

On the one hand, it is sufficient to accept one of the Grahame s hypotheses, the one on the independence of the compact-layer capacitance of the electrolyte concentration, in order to relate the SC value to the characteristics of the diffuse layer, that is, the change of its inverse capacitance with concentration,... [Pg.49]

Similar to Sect. 2.1.11.2, let us consider first the interaction of two charged species located at a small distance (atomic scale) from the metal-solvent interface. Once again, it turns out that the functional form of the U(R) dependence is only influenced by the same characteristic length, sLh, which had already appeared in Eq. (79) for the image potential, that is the product of the hulk dielectric constant of the solvent and the inverse value of the compact -layer capacitance, Eq. (80). [Pg.103]


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See also in sourсe #XX -- [ Pg.265 ]




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