Imaging applications fabrics

Results will be split into various sections the first of which will be fundamentals of hot spots. This will include a summary of the most important developments in the theory of SERS hot spots for both the EM and CT enhancement mechanisms. The second section will cover developments in tip-enhanced Raman spectroscopy (TERS) which represents the idealized hot spot. Then some issues regarding hot spots and the single molecule will be tackled such as the magnitude of enhancement required for single-molecule detection, the effects of molecular orientation with respect to the hot spot as well as the possible influence of optical forces. Sections 4.4 and 4.5 will cover developments in the imaging and fabrication of SERS hot spots, respectively, which have important implications for theoretical modeling as well control of SERS hot spots. The chapter will conclude by summarizing some of the applications of SERS hot spots that have been recently reported. 

Tao S, Gu ZH, Nathan A (2002) Fabrication of Gd202S Tb based phosphor films coupled with photodetectors for X-ray imaging applications. J Vac Sci Technol A Vac Surf Films 20 1091-1094... 

MP Nelson, ML Myrick. Fabrication and evaluation of a dimension-reduction fiber-optic system for chemical imaging applications. Rev Sci Instrum 70 2836-2844, 1999. 

A further targe market area for the use of chiral nematics is in decorative and novel product applications that use the visual appeal of the selective reflection properties. Mood-indicating jewellery and artifacts have been produced [250], as have images on fabrics and clothing [251, 252]. Wine bottles, coffee mugs, and drink mats are another area where chiral nematics have found amusing mass applications. Three dimen-... 

Due to its unique ability to directly image the local structure of a thin object with atomic resolution, HRTEM is an extremely powerful tool for materials research. Metals, ceramics, and semiconductors are some examples of prominent materials of interest. HRTEM imaging used to be a high-end research tool mostly used in academia, but has now become standard for a wide variety of applications from materials science research to defect analysis in industrial semiconductor fabrication lines. 

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