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HREM high resolution electron requirements

The appearance of the image will change in a complicated manner with very small changes in focus. Numerical simulation of the expected image from model structures is a very important part of high resolution electron microscopy (HREM) and this requires accurate determination of all the operating parameters, [40,45,46]. Other factors besides sin( f) that affect image formation and must be taken into account in... [Pg.77]

See other pages where HREM high resolution electron requirements is mentioned: [Pg.26]    [Pg.556]    [Pg.336]    [Pg.254]    [Pg.420]    [Pg.45]    [Pg.78]    [Pg.95]    [Pg.456]    [Pg.82]    [Pg.82]   
See also in sourсe #XX -- [ Pg.65 , Pg.66 , Pg.67 ]



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