High resolution profilometry

Real-space three-dimensional imaging in air, vacuum, or solution with unsurpassed resolution high-resolution profilometry imaging of nonconductors (SFM). 

Figure 3.2. Grain-boundary grooves formed on polycrystalline Ni surface (grain diameter of the order of 100 /mi) in two hours at 900CC. For wetting liquids, these grooves can act as capillaries. The profile was obtained by high-resolution optical profilometry.

Although this method is not commonly used outside of the research environment, it does provide absolute overall sputter yield information (overall, because this includes the effects of ion implantation if apparent), a fact realized as the mass removed is measured. In addition, this can be useful in cases where neither stylus profilometry nor optical profilometry is applicable. Disadvantages associated with this method lie in the fact that this does not reveal the condition of the initial surface nor the crater base formed, both of which are important if high-depth resolution is required. Extreme care must be employed when carrying out such measurements. 

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