High resolution images

Up-to-day reliability requirements as applied to NPP strength maintenance govern development of new generation of computerized systems for in-service inspection. These systems in parallel with capabilities of ordinary ultrasonic techniques allow to reconstruct high resolution image of inner flaw and increase available amount of information. 

The first step involved massive testing at ANDREX laboratory to determine the optimal detection process. Two imaging methods were discussed, one using a linear detector array, the other using a high resolution image intensifier. 

Krausch G, Hipp M, Bditau M, Mlynek J and Marti O 1995 High resolution imaging of polymer surfaces with chemical sensitivity Macromolecules 28 260... 

Figure C2.17.6. Transmission electron micrograph and its Fourier transfonn for a TiC nanocrystal. High-resolution images of nanocrystals can be used to identify crystal stmctures. In tliis case, tire image of a nanocrystal of titanium carbide (right) was Fourier transfonned to produce tire pattern on tire left. From an analysis of tire spot geometry and spacing, one can detennine that tire nanocrystal is oriented witli its 11001 zone axis parallel to tire viewing direction [217].

The uniqueness and desirability of EELS is realized when it is combined with the power of a TEM or STEM to form an Analytical Electron Microscope (AEM). This combination allows the analyst to perform spatially resolved nondestructive analysis with high-resolution imaging (< 3 A). Thus, not oiJy can the analyst observe the microstructure of interest (see the TEM article) but, by virtue of the focusing ability of the incident beam in the electron microscope, he or she can simultaneously analyze a specific region of interest. Lateral spatial resolutions of regions as small as 10 A in diameter are achievable with appropriate specimens and probe-forming optics in the electron microscope. 

The STEM is unrivaled in its ability to obtain high-resolution imaging combined with microanalysis from specimens that can be fashioned from almost any solid. Major applications include the analysis of metals, ceramics, electronic devices... 

The annular dark-field detector of the field-emission STEM (see Figure 2) provides a powerful high-resolution imaging mode that is not available in the conventional TEM or TEM/STEM. In this mode, images of individual atoms may be obtained, as shown in Figure 4 (see Isaacson, Ohtsuki, and Utlaut ). Some annular dark-field... 

As it can be observed from the high resolution images of tubules (Fig. 9(a)) their graphitic structure is generally defective. The defects can be of different... 

Fig. 6. High resolution image of straight part of an MWCNT the 0.21 nm spacing is resolved next to the basal 0.34 mm spacing. The 0.21 nm fringes are curved [9].

Fig. 7. High resolution images of ropes seen along their length axis. Note the hexagonal lattice of SWCNT s (Courtesy of A. Loiseau).

Fig. 10. Analysis of the atomic lattice images of the lead compound entering CNTs by capillary forces (a)detailed view of the high resolution image of the filling material, (b)tetragonal PbO atomic arrangement, note the layered structure and (c)tetragonal PbO observed in the [111] direction, note that the distribution of lead atoms follows the contrast pattern observable in (a), (d)bidimensional projection of the deduced PbO filling orientation inside CNTs as viewed in the tube axis direction, note that PbO layers are parallel to the cylindrical CNT cavity.

Thin polymer films may also be investigated by TEM and high resolution images are obtained for e.g. thin films of liquid crystalline polymers [64]. Usually thin microtome cuts from bulk samples are investigated, but also epitaxial growth of polyoxymethylene on NaCl [152], chain folding of polyethylene crystals [153], epitaxial crystallization of polypropylene on polystyrene [154] or monomolecular polystyrene particles [155] are observed. The resolution is, however, in most cases not comparable to STM. 

Atomic force microscopy (AFM) has become a standard technique for high-resolution imaging of the topography of surfaces. It enables one to see nanoscopic... 

Abstract We propose a general presentation of waveguides use in the frame of high resolution imaging by stellar interferometry. Brief recalls on guiding principle are followed by the required functions to be implemented. This paper is concluded by a present status on the experimental developments. 

Keywords High resolution imaging stellar interferometry optical fibers guided and inte-... 

In addition to this high sensitivity the polymer must be capable of giving high-resolution images. 

For the last 10 years, AFM applications to polymer and mbbery materials have been developed in a number of directions. High-resolution imaging of individual polymer molecules and studies of... 

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