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Grazing incidence x-ray diffraction patterns

Figure 11. Grazing incidence X-ray diffraction patterns (a) and OD spectra (b) of the as-implanted Au-Fe sample and of the sample after annealing at 600 °C for 1 h in reducing atmosphere, (c) Hysteresis loops of the as implanted Au-Fe and of the only-Fe samples measured at 3 K. Figure 11. Grazing incidence X-ray diffraction patterns (a) and OD spectra (b) of the as-implanted Au-Fe sample and of the sample after annealing at 600 °C for 1 h in reducing atmosphere, (c) Hysteresis loops of the as implanted Au-Fe and of the only-Fe samples measured at 3 K.
FIGURE 5.2.3 Two-dimensional grazing incidence x-ray diffraction patterns of poly(3-octyl thiophene) thin films cast on SiOj/Si substrates with various solution processing techniques from different solvents (a) chloroform (CHCI3) (b) toluene (c) tetrahydrofuran (THF) (d) methylene chloride (CH2CI2). (From Yang, H., unpublished data, 2006. With permission.)... [Pg.375]

Figure 9.5 shows how the order of a saniditic liquid crystal polymer 3 changes with annealing. The top and middle three images show grazing incidence X-ray diffraction patterns and AFM images of the surfaces, respectively. The left-hand... [Pg.252]

FIGURE 3.8 Grazing incidence x-ray diffraction (GIXD) pattern of a thin carbyne deposit. D = diamond substrate. [Pg.46]

Unique information about the unit cell in quasi-crystaUine monolayers can be obtained from X-ray °, neutron , heUum or low energy electron diffraction (LEED) data. In the grazing incidence X-ray diffraction (GIXD) experiment the beam is directed at the coated surface at a low angle and experiences total internal reflection from the metal support underneath the monolayer. The analysis of reflectivity and diffraction pattern of this reflected beam provides information about the molecular structure of the crystalline films, the thickness and refractive index of the layers and the roughness of the surface s . These experiments, however, require sophisticated and expensive equipment and are not therefore used routinely for monolayer characterization. [Pg.558]

We prepared thin film Pt alloy electrodes by Ar-sputtering Pt and the second metal targets simultaneously onto a disk substrate at room temperature (thickness approximately 200 nm). The resulting alloy composition was determined by gravimetry and X-ray fluorescent analysis (EDX). Grazing incidence (i7= 1°) X-ray diffraction patterns of these alloys indicated the formation of a solid solution with a face-centered cubic (fee) crystal stmeture. [Pg.318]

Grazing incidence angle X-ray diffraction pattern for InSe... [Pg.54]

The quality, perfection, and stability of the layered assemblies and details of their internal architecture can be analyzed by a combination of different methods such as X-ray diffraction, spectroscopic (IR, UV/Vis, Raman) techniques, wave-guide spectroscopy and so on [74]. As an example. Figure 9.5 shows the small-angle X-ray diffraction pattern obtained at a grazing incident from an assembly of 28 copoly(glutamate) layers on a silicon wafer [82,83]. The insert represents a molecular picture of the assembly with only two of the 28 layers drawn. [Pg.291]

Fig. 2. X-ray diffraction pattern obtained at 2° grazing incidence from 304 stainless steel of untreated samples and samples treated at different C2H2/N2 gas pressure ratios. Fig. 2. X-ray diffraction pattern obtained at 2° grazing incidence from 304 stainless steel of untreated samples and samples treated at different C2H2/N2 gas pressure ratios.
Fig. 39. Grazing incidence angle x-ray diffraction (XRD) pattern of an InAslO/InSblO-41x superlattice. Fig. 39. Grazing incidence angle x-ray diffraction (XRD) pattern of an InAslO/InSblO-41x superlattice.
Fig. 35 Grazing incidence angle X-ray diffraction (XRD) pattern of an lnAslO/lnSblO-41X superlattice. The incident angle was 0.50°. (Adapted from Ref [52].)... Fig. 35 Grazing incidence angle X-ray diffraction (XRD) pattern of an lnAslO/lnSblO-41X superlattice. The incident angle was 0.50°. (Adapted from Ref [52].)...
Although conventional electron-probe microanalysis appears to be unsuitable for analysis of the exposed surface layer of atoms in an alloy catalyst, recent developments have shown that X-ray emission analysis can still be used for this purpose (89, 90). By bombarding the surface with high energy electrons at grazing incidence, characteristic Ka radiation from monolayer quantities of both carbon and oxygen on an iron surface was observed. Simultaneously, information about the structure of the surface layer was obtained from the electron diffraction pattern. [Pg.144]


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