Goos-Hanchen effect

During the process of total reflection at a vacuum boundary, the reflected beam has been observed to be subject to a parallel displacement with respect to the incident beam. For this so-called Goos-Hanchen effect, the displacement was further found to have a maximum for parallel polarization of the incident electric field, and a minimum for perpendicular polarization [24,25]. At an arbitrary polarization angle, however, the displacement does not acquire an intermediate value, but splits into the two values for parallel and perpendicular polarization. This behaviour cannot be explained by conventional electromagnetic theory. 

L. de Broglie, and J. P. Vigier, Masse du photon, Effet Imbert et effet Goos-Hanchen en lumiere incidente polarisee (Photon mass, imbert effect and Gooshanchen effect in polarized light), C. R. Acad. Sci., Ser B (Sciences Physiques), 273B(25), 1069-1073 (1971). 

The effective thickness, fgff, takes into account the Goos-Hanchen shift effects and is given by ... 

Hirschfeld [163] attempted to correlate the Goos-Hanchen shift (1.4.11°) with the penetration depth and the effective thickness [Eq. (1.114)]. However, Epstein [164] reexamined the problem and revealed that there is no simple relation between these quantities, because the Goos-Hhnchen shift involves non-homogeneous waves, whereas the penetration depth and the effective thickness are determined as the decay of a homogeneous wave. 

White, I. A. and Pask, C. (1977) Effect of Goos-Hanchen shifts on pulse widths in optical waveguides. Appl. Opts., 16, 2353-5. 

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