Geometries and Sample Preparation

Section 20.2 presents the sample geometries and preparation techniques, and Sections 20.3 and 20.4 summarise oiu findings for bottom and top contact geometries, respectively. In the latter case, we compare gate oxides with and without application of an OTS self-assembled monolayer. The main achievements of the present work are summarised in Section 20.5. 

For the top-contacted OFETs, highly p-doped silicon substrates with 100 nm thermally grown Si02 were used. For contacting the structure in situ, it was 

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The results reported by the different groups have all been obtained with experimental arrangements that differ greatly in the types of laser used, the wavelengths, time regime- and irradiances on the sample, in the sample geometry and sample preparation, the mass spectrometers and the detection systems. The most pertinent information on the different systems that have been successfully applied to organic mass spectrometry is compiled in ref. (). 

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