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Fringe formation

Figure 3.44 Wedge fringe formation at a stacking fault. The face of stacking fault divides a face-centered cubic crystal into parts 1 and 2. A transmitted beam column crossing the fault is similar to that crossing a grain boundary as shown in Figure 3.39b. Figure 3.44 Wedge fringe formation at a stacking fault. The face of stacking fault divides a face-centered cubic crystal into parts 1 and 2. A transmitted beam column crossing the fault is similar to that crossing a grain boundary as shown in Figure 3.39b.
Shear Stress Sensors, Fig. 5 Schematic showing (a) fringe formation for oil height measwement and (b) an experimental setup using oil-film interferometry... [Pg.2968]

Shear Stress Sensors, Figure 5 Schematic showing (a) fringe formation... [Pg.1823]

The schematic showing (a) the fringe formation for oil height measurement... [Pg.551]

Figure 3.6). This theory known as the fringed mieelle theory or fringed crystallite theory helped to explain many properties of crystalline polymers but it was difficult to explain the formation of certain larger structures such as spherulites which could possess a diameter as large as 0.1 mm. [Pg.50]

In the past decade, effects of an EEF on the properties of lubrication and wear have attracted significant attention. Many experimental results indicate that the friction coefficient changes with the intensity of the EEF on tribo-pairs. These phenomena are thought to be that the EEF can enhance the electrochemical reaction between lubricants and the surfaces of tribo-pairs, change the tropism of polar lubricant molecules, or help the formation of ordered lubricant molecular layers [51,73-77]. An instrument for measuring lubricant film thickness with a technique of the relative optical interference intensity (ROII) has been developed by Luo et al. [4,48,51,78] to capture such real-time interference fringes and to study the phenomenon when an EEF is applied, which is helpful to the understanding of the mechanism of thin film lubrication under the action of the EEF. [Pg.55]

Figure 5. Schematic arrangement for hologram formation with an electron biprism. A plane wave illuminates the specimen placed off-axis. After the object lens a wire is placed between two earthed plates. The wire is the electron optical analog of a Fresnel biprism and causes the unperturbed and perturbed waves forming the electron hologram to interfere. The object phase-shift causes a displacement in the hologram fringes, and is thus observable. Figure 5. Schematic arrangement for hologram formation with an electron biprism. A plane wave illuminates the specimen placed off-axis. After the object lens a wire is placed between two earthed plates. The wire is the electron optical analog of a Fresnel biprism and causes the unperturbed and perturbed waves forming the electron hologram to interfere. The object phase-shift causes a displacement in the hologram fringes, and is thus observable.
The measured or apparent hydrocarbon thickness is not only dependent on the capillary fringe but also on the actual hydrocarbon thickness in the formation (Figure 6.6b). In areas of relatively thin LNAPL accumulations, the error between the apparent well thickness and actual formation thickness can be more pronounced than in areas of thicker accumulations. The larger error reflects the relative difference between the thin layer of LNAPL in the formation and the height it is perched above the water table. The perched height is constant for thick and thin accumulations however, a thick accumulation can depress and even destroy the capillary fringe as illustrated in Figure 5.1. [Pg.174]

Classification3 Minimum Apparent Thickness, cm Formation Factor (F), cm Capillary Fringe Height,b cm U.S. Standard Sieve Size Rang... [Pg.182]

The resulting LNAPL thickness is conservative in that it incorporates both the actual thickness of LNAPL in the adjacent formation and the height of the capillary fringe. For most practical purposes, this level of accuracy is sufficient, although the more complex and extensive the site conditions, the more sophisticated approaches may be warranted, as discussed later in this chapter. [Pg.192]

Fig. 207. Formation of image of patterned line-grating of Plate VI by-superposition of different sets of interference fringes, each set being produced by a pair of diffracted beams. Fig. 207. Formation of image of patterned line-grating of Plate VI by-superposition of different sets of interference fringes, each set being produced by a pair of diffracted beams.

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