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Frequency, carrier dielectric excitation

The third relaxation process is located in the low-frequency region and the temperature interval 50°C to 100°C. The amplitude of this process essentially decreases when the frequency increases, and the maximum of the dielectric permittivity versus temperature has almost no temperature dependence (Fig 15). Finally, the low-frequency ac-conductivity ct demonstrates an S-shape dependency with increasing temperature (Fig. 16), which is typical of percolation [2,143,154]. Note in this regard that at the lowest-frequency limit of the covered frequency band the ac-conductivity can be associated with dc-conductivity cio usually measured at a fixed frequency by traditional conductometry. The dielectric relaxation process here is due to percolation of the apparent dipole moment excitation within the developed fractal structure of the connected pores [153,154,156]. This excitation is associated with the selfdiffusion of the charge carriers in the porous net. Note that as distinct from dynamic percolation in ionic microemulsions, the percolation in porous glasses appears via the transport of the excitation through the geometrical static fractal structure of the porous medium. [Pg.40]

The characteristic composite behavior of (t maM for medium consisting of spherical particles with volume fractions / of Drude conductor and 1 - / of insulator is shown in Figure 15.5. For a volume fraction / less than the percolation value (/ = 1/3 for spheres), (Tema (impurity band of localized plasmon-like excitations. As the system approaches the percolation threshold, the localized peak o-ema(w) shifts to lower frequency. Above the percolation threshold, a Drude peak corresponding to the carriers that have percolated through the composite structure occurs at low frequency. Only a fraction ( (3/— l)/2 [119]) of the full conduction electron plasma frequency appears in the Drude peak, depending on the proximity to the percolation threshold. The same percolating free electron behavior is observable in the dielectric response ema(w) for the system. [Pg.606]


See other pages where Frequency, carrier dielectric excitation is mentioned: [Pg.5699]    [Pg.407]    [Pg.49]    [Pg.180]    [Pg.117]    [Pg.64]    [Pg.607]    [Pg.4231]    [Pg.520]    [Pg.332]    [Pg.103]    [Pg.518]    [Pg.91]    [Pg.91]    [Pg.44]   
See also in sourсe #XX -- [ Pg.195 ]




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Excited frequency

Exciting frequencies

Frequency, excitation

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