Fragment size analysis materials

IR analysis can be applied to surfaces [3] and pyrolyzed fragments of polymeric materials [4] for purposes of identification. In particular, FTIR microscopes are useful for evaluating micron-sized regions of fiber, film, and coating samples. The FTIR microscope can be used as a conventional optical microscope, but, in addition, an IR spectrometer is attached to the microscope. It is possible to direct the image beam through the spectrometer and collect sample spectra. Of particular use is the fact that silicon wafers, the substrates used to build most microelectronics, are transparent in the IR. Thus, this substrate is ideal for use in thin film analysis. 

Cone and square Used with powdered samples. The materials are mixed, with any larger fragments reduced in size. From here, the material will be split into four sections on a clean, flat surface. Two of the squares (opposite to each other) wfll be removed and the two left will be recombined with the procedure being repeated until an appropriate sample size for analysis is achieved. 

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