Field emission scanning electron micrograph

Figure 8. (a) Field emission scanning electron micrograph of a lead structure before the nanocrystals are introduced. The light gray... 

Fig. 28.33 Field-emission scanning electron micrograph (SEM) of bundles of carbon nanotubes grown on an Si wafer. Magnification is X 35 000. The sample was provided by Dr Teresa de los Arcos, Department of Physics, University of Basel. SEM image Dr A. Wirth-Heller, FHNW, Basel.

Figure 15.8 Morphology and topography of CNCs (a) field emission scanning electron micrograph (FESEM, 500 nm scale) (b) transmission electron microscopy image (TEM, 500 nm) (c) atomic force microscopy (AFM, 2 pm scale) [76].

In order to exploit the application of titania in electronic ceramics, Nair et al. (1999) studied sintering of nanostructured pure and doped titania samples. An aqueous sol containing titania particles of 10 nm or less size was used for the preparation ofpure and Cu, Ni, La-doped gel samples. The densification temperature and properties of some selected titania compositions are also shown in Table 6-2. Figures 6-2(a) and (b) show the field emission scanning electron micrographs (FE-SEM) ofpure titania sintered at 750°C and 800°C for 8 h. It may be noted that the 750°C calcined gel samples, though porous. 

Fig. 6-1 Field Emission Scanning Electron Micrographs of Below and Above CPVC Coatings. (A) shows the surface image obtained from a gloss enamel coating which has been formulated significantly below CPVC. (B) shows...

Figure 20.1 Micrographs of nanoscaled fillers (a) serpentine powder, (b) Ser-KAc compound, (c) worm-Uke EG, (d) and (e) FESEM (Field Emission Scanning Electron Microscopy) for nano-EG. Panel (d) denotes the whole micrograph and panel (e) indicates the enlarged micrograph in the rectangular region.

Figure 1249 Electron micrographs of UHMWPE shish-kebabs by field emission scanning electron microscopy (FE-SEM). Somani [232]. Reproduced with permission of Elsevier.

Scanning electron micrographs were recorded on a Hitachi S-800 field emission microscope. 

Scanning electron microscope (SEM) photographs were taken on a DSM982 Gemini microscope with a field emission gun operated at 1 kV voltage. Samples were characterized without any metallic coating. The occurrence of the observed features was checked at different sites on the samples, so that SEM micrographs presented below are representative of the whole sample. 

The composition of the deposited solder was measured by energy dispersive x-ray measurements using standards in a scanning electron microscope. For each deposit, four square regions measuring 1.5 mm per side were sampled. A scanning electron microscope with a field emission source was employed for the micrographs of the samples. X-ray diffraction measurements were also made on selected samples, in order to determine the structure and orientation of the deposits. 

Glassy carbons (GCs), obtained by pyrolysis and heat treatment of thermosetting resins above 1000°C, are hard and brittle materials that fail suddenly when loaded in tension or compression. In commercially available GCs, the mean grain diameter, evaluated from micrographs under a field-emission electron gun type scanning electron microscopy, and the crystallite sizes, calculated from X-ray powder diffraction profiles, both slightly increased with the elevation of heat treatment tempera-ture(HTT) from 1000°C to 3000°C. ... 

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