Fiber scanning optical microscopy

Near-field scanning optical microscopy (NSOM) is a type of microscopy where a sub-wavelength light source is used as a scanning probe. This fiber optic probe is coated with metal except for a small region at the tapered fiber tip, which is... 

E Betzig, SG Grubb, RJ Chichester, DJ Digiovanni, JS Weiner. Fiber laser probe for near-held scanning optical microscopy. Appl Phys Lett 63(26) 3550-3552, 1993. 

Physical testing appHcations and methods for fibrous materials are reviewed in the Hterature (101—103) and are generally appHcable to polyester fibers. Microscopic analyses by optical or scanning electron microscopy are useful for evaluating fiber parameters including size, shape, uniformity, and surface characteristics. Computerized image analysis is often used to quantify and evaluate these parameters for quaUty control. 

More recently, the method of scanning near-field optical microscopy (SNOM) has been applied to LB films of phospholipids and has revealed submicron-domain structures [55-59]. The method involves scanning a fiber-optic tip over a surface in much the same way an AFM tip is scanned over a surface. In principle, other optical experiments could be combined with the SNOM, snch as resonance energy transfer, time-resolved flnorescence, and surface plasmon resonance. It is likely that spectroscopic investigation of snbmicron domains in LB films nsing these principles will be pnrsned extensively. 

Nagahara, T., Imura, K. and Okamoto, H. (2004) Time-resolved scanning near-field optical microscopy with supercontinuum light pulses generated in microstructure fiber. Rev. Sci. Instrum., 75, 4528-4533. 

Figure 3. Images of a cross-section of carbon fibers after propylene pyrolysis. 3a Scanning Electron Microscopy of a piece of the carbon cloth. 3b optical microscopy (crossed polarizers with a wave retarding plate).

Fig. 5. Scanning confocal optical microscopy for single-molecule detection. Sample scanning configuration. The fiber exit and the active area of the SPAD serve as confocal pinholes. S sample, O high-NA microscope objective, DM dichroic mirror, L1,L2 lenses, F Filters.

Fig. 1 Scanning electron microscopy (SEM) images showing (a) multiple well pits used to confine the sensor beads (reproduced from [2]). (b) Etched fiber optic end filled with 3 im beads (reproduced from [3]). (c) Etched array housing 2 xm bead (from Illumina )...

FIGURE 10.30 Scanning electron microscopy (SEM) images of cross section of a commercial optical fiber coated with a NaA zeoUte thick layer (a) total cross section and (b) magnification view of the NaA zeolite layer. (From Lopez, J., Pina, M.P., Coronas, J., Pelayo, J., and Santamaria, J., A novel optical device for gas sensor applications based on zeolitic materials. Books of abstracts of the 1st NanoSpain Workshop, San Sebastian, 2004.)... 

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