ESEM images electron microscope

ESEM environmental scanning electron microscope ESI electron spectroscopic imaging... 

Fig. 15.6 Environmental scanning electron microscope (ESEM) images of (a) the BmimPF -MWCNT gel modified the graphite electrode surface (inset high-magnification ESEM image) and (b) the BmimPF -MWCNT gel modified the GC electrode surface after immersing in water for 10 h (Reproduced from Ref. [99] with kind permission of Elsevier)...

The hot stage has not only been applied to optical and atomic force microscopes, but also to scanning electron microscopes. Hot-stage accessories are available on environmental SEMs that can collect ESEM images at elevated temperatures. Applications to the electronics industry include fluxless soldering, intermetallic growth studies, and copper thick-film sintering studies (92-94). 

Figure 4 Second electron images of cement pastes with and without SBR dispersion or powder observed by environmental scanning electron microscope (ESEM).

Fig. 10 Enviromnental scanning electron microscopic (ESEM) images of a film cast from 5 + 6 at various temperatures (magnification x 200). (Image reprinted with permission from [74], copyright 2009 RSC)...

The conventional SEM measurement carried out in a vacuum has disadvantages and may also result in artifacts. Moreover, the coating can obscure the fine surface structure details of some non-electroconductive samples. In the 1980s, the environmental scanning electron microscope (ESEM) was developed, " which permits the imaging of wet systems with no prior specimen preparation. Since the sample environment can be dynamically altered, hydration... 

Another method is automated serial sectioning of specimens with an ultramicrotome integrated into an environmental scanning electron microscope (ESEM). This method involves imaging the surface of the specimen after removal of each slice. The reason for the choice of an ESEM (or a variable-pressure SEM) is to avoid specimen charging. The experimental setup of such an ultramicrotome operating in situ within an ESEM is described in [16]. 

A Scanning Electron Microscope (SEM, FEI ESEM XL30 FEG) was used to analyze specimen stubs prepared with a diamond knife. Staining was done with gaseous RUO4. FTIR-Imaging Microscope (Continuum XL, Thermo) was used to simultaneously collect morphological and spectroscopic information. 

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