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Epitaxy mica substrate

Fig. 26a. Scanning tunneling microscopic image of a 310nmx310nm area of bare Au film epitaxially grown on a mica substrate (Au mica) measured in air constant current mode bias (Vb) of + 50 mV, tunneling current (I,) of 10 nA. b STM image of a 3.5 nm x 3.5 nm area of a bare Au/mica film constant current mode Vb = 4- 4.9 mV I, = 3.0 nA [219]... Fig. 26a. Scanning tunneling microscopic image of a 310nmx310nm area of bare Au film epitaxially grown on a mica substrate (Au mica) measured in air constant current mode bias (Vb) of + 50 mV, tunneling current (I,) of 10 nA. b STM image of a 3.5 nm x 3.5 nm area of a bare Au/mica film constant current mode Vb = 4- 4.9 mV I, = 3.0 nA [219]...
Atomic force microscopy (AFM) has become a very useful tool for analyzing epitaxially grown thin flhns. When the polymer contact plane can be exposed (for example, by dissolution of the substrate, or even by physically detaching the polymer overgrowth from, e.g., a mica substrate), AFM makes it possible to image not... [Pg.240]

Figure Bl.19.27. AFM topographic images (7x7 pm ) of 20 epitaxial Ag films on mica prepared at five substrate temperatures (75, 135, 200, 275, and 350 °C) and four film thicknesses (50, 110, 200, and 300 mn)... Figure Bl.19.27. AFM topographic images (7x7 pm ) of 20 epitaxial Ag films on mica prepared at five substrate temperatures (75, 135, 200, 275, and 350 °C) and four film thicknesses (50, 110, 200, and 300 mn)...
Many of the various techniques associated with metal film preparation have recently been reviewed by Klemperer (76). Much of the catalytic work with thick continuous films has used a cylindrical reaction vessel (Fig. 7a). This cylindrical geometry permits a cylindrical sleeve of mica sheet to be inserved and used as the film substrate for epitaxial film growth... [Pg.16]

Fig.63. SFM-micrographs of the monolayers on a HOPG and b mica prepared by spin casting of 14-ABG-PS solutions in cyclopentane (c=0.1 mg/ml). Individual molecules in (a) aligned parallel to the substrate and bent at characteristic angles of 60 ° and 120 °. This indicates epitaxial adsorption of the alkyl tails according to the three fold symmetry of graphite. The worm-like molecules in (b) wound around each other and resulted in a felt-like structure [596]. The inserts illustrate specific interaction of the side chains with HOPG (a) and their absence on mica (b)... Fig.63. SFM-micrographs of the monolayers on a HOPG and b mica prepared by spin casting of 14-ABG-PS solutions in cyclopentane (c=0.1 mg/ml). Individual molecules in (a) aligned parallel to the substrate and bent at characteristic angles of 60 ° and 120 °. This indicates epitaxial adsorption of the alkyl tails according to the three fold symmetry of graphite. The worm-like molecules in (b) wound around each other and resulted in a felt-like structure [596]. The inserts illustrate specific interaction of the side chains with HOPG (a) and their absence on mica (b)...
Epitaxial crystallization of polymers has been investigated for a wide variety of substrates minerals (alkali halides, talc, mica, and so on), low molecular weight organic materials (condensed and linear aromatics, benzoic acid and many of its substituted variants and their salts or hemiacids, other organic molecules of different types), and other crystalline polymers. [Pg.24]

The most thoroughly characterized surface diffraction study at a single crystal surface is that of underpotentially deposited lead on a silverfl 11) single crystal electrode (epitaxial film on mica). " These investigators began by measuring the CTR of the silver substrate since, unless these were clearly observed, it would be unlikely that diffraction from an electrodeposited monolayer would be detected. [Pg.322]

Rubrene was purchased from Aldrich (elemental purity > 98%) and additionally purified by gradient sublimation Freshly cleaved mica (001) was used as substrate. Rubrene thin films were deposited by hot wall epitaxy in a vacuum chamber with a base pressure below 10 Pa at different deposition rates and substrate temperatures (Ts). Pole figures were measured with a Philips X pert x-ray diffractometer using CrKa radiation and a secondary side graphite monochromator. Specular scans were performed on a Bruker D8-Discover diffractometer using CuKa radiation. POWDER CELL and STEREOPOLE were used for the evaluation of the specular scans and simulation of pole figures. [Pg.54]

A number of papers have reported on the resistivity of EuS films. Ahn and Shafer (1971) noticed a low electrical resistivity in Eu-excess films. Palatnik et al. (1979) showed that the nature of the substrate can change the resistivity, e.g. l0 flcm for epitaxial deposition on NaCl and 10 ftcm for polycrystalline films on glass or mica (the epitaxial films are mechanically unstable). Feierabend et al. [Pg.97]


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