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Environmental secondary electron detector

A new environmental secondary electron detector (ESED) has been produced by Hitachi for its SEM. It provides an alternative to the traditional back-scattered imaging and closely mimics a conventional secondary electron detector to yield good surface information. The new ESED picks up ions as well as electrons, creates an avalanche effect with the ions and produces a better quality image. [Pg.132]

ESEM (Environmental Scanning Electron Microscopy) with an EDX (Energy Dispersive X-ray) attachment was used to provide surface chemistry data. The ESEM is equipped with a LaBa gun and is fully equiped with a range of secondary electron and back scattered electron detectors. Corrections for atomic number, absorbtion and fluorescence are achieved through a virtual standard calibration routine. The EDX... [Pg.42]

See other pages where Environmental secondary electron detector is mentioned: [Pg.311]    [Pg.311]    [Pg.189]    [Pg.190]    [Pg.627]    [Pg.40]    [Pg.147]    [Pg.185]    [Pg.343]    [Pg.26]    [Pg.138]    [Pg.486]    [Pg.870]    [Pg.39]   


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