Energy Dispersion Spectroscopy EDS

The incoming electron beam interacts with the sample to produce a number of signals that are subsequently detectable and useful for analysis. They are X-ray emission, which can be detected either by Energy Dispersive Spectroscopy, EDS, or by Wavelength Dispersive Spectroscopy, WDS visible or UV emission, which is known as Cathodoluminescence, CL and Auger Electron Emission, which is the basis of Auger Electron Spectroscopy discussed in Chapter 5. Finally, the incoming... 

Catalysts were characterized using SEM (Hitachi S-4800, operated at 15 keV for secondary electron imaging and energy dispersive spectroscopy (EDS)), XRD (Bruker D4 Endeavor with Cu K radiation operated at 40 kV and 40 mA), TEM (Tecnai S-20, operated at 200 keV) and temperature-programmed reduction (TPR). Table 1 lists BET surface area for the selected catalysts. 

In order to confirm the formation of nanodots, the fabricated nanodot arrays on a substrate were examined using energy dispersive spectroscopy (EDS). The EDS analysis of niobium oxide arrays on Si film before etching (Fig. 2(a)) was shown in Fig. 3(a). The Si peak as well as Nb and O peaks was observed because niobium oxide on Si film was so thin. 

Secondly, the characteristic X-rays, emitted as the electrons displaced from the inner shells of the atoms are replaced, can be detected by use of an energy-sensitive detector placed close to the specimen. An account of the application of both the energy dispersive spectroscopy (EDS) of the emitted X-rays and EELS to the... 

EPMA is a technique for chemically analysing small selected areas of solid samples, in which X-rays are excited by a focused electron beam. Spatial distribution of specific elements can be recorded as two-dimensional X-ray maps using either energy dispersive spectroscopy (EDS) or... 

Although a number of secondary minerals have been predicted to form in weathered CCB materials, few have been positively identified by physical characterization methods. Secondary phases in CCB materials may be difficult or impossible to characterize due to their low abundance and small particle size. Conventional mineral identification methods such as X-ray diffraction (XRD) analysis fail to identify secondary phases that are less than 1-5% by weight of the CCB or are X-ray amorphous. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM), coupled with energy dispersive spectroscopy (EDS), can often identify phases not seen by XRD. Additional analytical methods used to characterize trace secondary phases include infrared (IR) spectroscopy, electron microprobe (EMP) analysis, differential thermal analysis (DTA), and various synchrotron radiation techniques (e.g., micro-XRD, X-ray absorption near-eidge spectroscopy [XANES], X-ray absorption fine-structure [XAFSJ). 

Energy Dispersive Spectroscopy, EDS, was performed on the product. From EDS areal scanning the magnesium content is 1.4% while the zirconium content is 98.6% by atom number fairly far away from the desired ratio of about 10 90. 

The identification and characterisation of these nanoband-like image patterns is the aim of the present work. Thus, we investigate the occurrence of such nanobands in an Mg-Al-CCh-LDH adsorbed with sodium octylsulfate (SOS), sodium octyl- and dodecylbenzenesulfonate (SOBS and SDBS, respectively). Energy Dispersion Spectroscopy (EDS) was also used to analyse the nanobands observed for the SDS-adsorbed LDH. The influence of thermal treatment, washing with water, and the deposition process on the occurrence of nanobands were also studied. 

This chapter summarizes results obtained during the past 5 years, on the design, preparation and study of titanium and vanadium compounds as candidate precursors to TiC, TiN, VC, and VN. The study of the precursor molecules was conducted through several steps. After their synthesis, thermoanalytical studies (TG-DTA), coupled to simultaneous mass spectroscopic (MS) analysis of the decomposition gases, were carried out to determine their suitability as precursors. CVD experiments were then conducted and were followed by characterization of the deposits by scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and electron microprobe analysis with wavelength dispersion spectroscopy (EPMA-WDS). 

Bulk spectroscopic techniques such as x-ray fluorescence and optical and infrared spectroscopies involve minimal sample preparation beyond cutting and mounting the sample. These are discussed in Section 9.2.1. Spectroscopic techniques such as wavelength dispersive spectroscopy (WDS) and energy dispersive spectroscopy (EDS) are performed inside the SEM and TEM during microscopic analysis. Therefore, the sample preparation concerns there are identical to those for SEM and TEM sample preparation as covered in Section 9.3. Some special requirements are to be met for surface spectroscopic techniques because of the vulnerability of this region. These are outlined in Section 9.5. 

Particle composition is far more difficult to evaluate. Bulk elemental analysis [atomic absorption spectroscopy (AA) or inductively coupled plasma mass spectrometry (ICP-MS) are most common for metals] is useful in confirming the overall bimetallic composition of the sample, but provides no information regarding individual particles. Microscopy techniques, particularly Energy Dispersive Spectroscopy (EDS), has supported the assertion that bimetallic DENs are bimetallic nanoparticles, rather than a physical mixture of monometallics [16]. Provided the particle density is low... 

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