Electron Effective-Attenuation-Length Database

C.J. PoweU and A. Jablonski, Electron Effective Attenuation Length Database, Version 1.0 (SRD 82), US Department of Commerce, National Institute of Standards and Technology, Gaithersburg, 2000. 

DDFs can be calculated from Eq. (3.2.3.2) by specifying the experimental configuration (the angle a and the angle P between the direction of the X-rays and the direction of the analyzer) and parameters for particular photoelectrons from a given solid (/3, Xin, and Xtr). Since the formalism is rather complex, DDFs can be obtained more conveniently from the NIST Electron Effective-Attenuation-Length Database (SRD 82) [41]. 

A. (2011) NIST Electron Effective-Attenuation-Length Database,... 

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See also in sourсe #XX -- [ , ]

See also in sourсe #XX -- [ , ]

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