Electron diffraction studying molecular aggregation

For the label of specificity, criterion (2), we must appeal to a more limited area of study, to spectroscopic and diffraction data. The most definitive data are, no doubt, those which indicate atom positions in the molecular aggregate. Thus, x-ray diffraction, neutron diffraction, and certain nuclear resonance studies of solids can provide more or less direct evidence that there are H atoms which occupy positions of close approach (hence bonding distance) to two other atoms. Electron diffraction spectra can yield the same information for gaseous species. More easily obtained, however, are IR and Raman spectra, which reveal specific involvement of H atoms by peculiarities in their vibrationeil degrees of freedom in the molecular aggregate. Finally, high resolution proton magnetic resonance studies provide a sensitive index of the electronic environment of the H atoms. 

The limit of stability of the crystal framework at different extents of Ni ion exchange of type A molecular sieve is shown by means of electron microscopy, differential thermal analysis, and x-ray diffraction. The data obtained from catalytic studies are in accord with the results of physical methods, showing preservation of the molecular sieve properties after reduction of the Ni ions. Metallic Ni aggregates on the external surface of the zeolite. In the dehydrogenation of cyclohexane and the hydrogenolysis of n-hexane, type A molecular sieve shows the properties of metallic Ni on an inert support. When NiNaA is mixed mechanically with CaY, a typical bifunctional catalyst is obtained. 

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