Electrochemical atomic force microscopy ECAFM

Atomic force microscopy (AFM) and electrochemical atomic force microscopy (ECAFM) have proven usefiil for the study of nucleation and growth of electrodeposited CP films on A1 alloy [59]. AFM was used to study adhesion between polypyrrole and mild steel [60], whereas electric force microscopy (EFM) has been used to study local variations in the surface potential (work function) of CP films [61]. AFM with a conductive tip permits a nanoscale AC impedance measurement of polymer and electrolyte interfaces, permitting differentiation between highly conductive amorphous regions and less-conductive crystalline regions of the CP film [62]. 

F. Chao, M. Costa, and C. Tian, Modification of poly(3-methylthiophene) (PMeT) structure during electrochemical doping-undoping, studied by in situ atomic force microscopy (ECAFM). Synth. Met., 75, 85 (1995). 

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