Dynamic percolation, ionic microemulsions

The third relaxation process is located in the low-frequency region and the temperature interval 50°C to 100°C. The amplitude of this process essentially decreases when the frequency increases, and the maximum of the dielectric permittivity versus temperature has almost no temperature dependence (Fig 15). Finally, the low-frequency ac-conductivity ct demonstrates an S-shape dependency with increasing temperature (Fig. 16), which is typical of percolation [2,143,154]. Note in this regard that at the lowest-frequency limit of the covered frequency band the ac-conductivity can be associated with dc-conductivity cio usually measured at a fixed frequency by traditional conductometry. The dielectric relaxation process here is due to percolation of the apparent dipole moment excitation within the developed fractal structure of the connected pores [153,154,156]. This excitation is associated with the selfdiffusion of the charge carriers in the porous net. Note that as distinct from dynamic percolation in ionic microemulsions, the percolation in porous glasses appears via the transport of the excitation through the geometrical static fractal structure of the porous medium. 

The set of structural parameters obtained by fitting and by using relationship (79) allows us to reconstruct the cluster size distribution function w(s,sm) and to treat the dynamic percolation in ionic microemulsions in terms of the classical static percolation model. 

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