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Device reliability, Inhibited

Although less widely reported than the effects of vapours, contact corrosion has been a serious problem in packaging and in electronicsAs miniaturisation and sophistication of electronic devices has increased, the hazard presented by corrosion is often the limiting factor inhibiting the attainment of expected levels of reliability. [Pg.954]

Mechanical shock is one of the automotive reliability tests that an accelerometer must survive. Often, these excursions are specified beyond the maximum g-range of the device. Mechanically, this shock magnitude creates the possibility of substantial proof mass movement. To maintain integrity of the mechanical structure in this environment, many accelerometers use another structural material layer to provide a stop to the proof mass that inhibits the movement. An example of an overtravel stop on a lateral accelerometer is shown in Fig. 7.1.12g. [Pg.273]


See other pages where Device reliability, Inhibited is mentioned: [Pg.140]    [Pg.135]    [Pg.125]    [Pg.585]    [Pg.437]    [Pg.1319]    [Pg.308]    [Pg.298]    [Pg.61]    [Pg.237]    [Pg.500]    [Pg.87]    [Pg.135]    [Pg.249]    [Pg.96]   


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Device reliability

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