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Current-Voltage JV Measurement

Therefore, the /scl can be predicted if the field-dependent mobilities are known from an alternative method, such as TOF measurement. [Pg.77]

However, experimental ]V curves often deviate from the ideal /scl- In these cases, the measured current /inj is injection limited caused by a nonohmic contact or poor surface morphology. When the MO interface is nonohmic, carrier injection can be described by the Richardson-Schottky model of thermionic emission the carriers are injected into organic solid only when they acquire sufficient thermal energy to overcome the Schottky barrier ((()), which is related to the organic ionization potential (/p), the electron affinity (AJ, the metal work function (O, ), and the vacuum level shift (A) [34,35]. Thus, the carrier injection efficiency (rj) can be calculated by the following equation  [Pg.77]


Several experimental techniques are used to investigate the carrier injection and transport in organic solids. TOP technique, current-voltage (JV) measurement, AS measurement, and DISCLC measurement are used and cross-compared. Table 3.2 shows a summary of fhese fechniques. [Pg.71]


See other pages where Current-Voltage JV Measurement is mentioned: [Pg.64]    [Pg.76]   


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