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Copper surface measurements

The vibrational spectrum of benzene around 1000 cnf has also been measured. IQ. Benzene was physisorbed on a cooled copper substrate in the vacuum chamber. Figure 19 shows the transmission for several thicknesses of benzene and a prism separation of 3 cm. The thickness was determined from the measured transmission in transparent regions using Eg. (7). The solid curves were calculated from Eqs. (5) and (6) using optical constants for benzene obtained from an ordinary transmission experiment.il The benzene film was assumed to be isotropic. Of the two absorption lines seen, one belongs to an in-plane vibrational mode, and one to an out-of-plane vibration. Since the electric field of the SEW is primarily perpendicular to the surface, the benzene molecules are clearly not all parallel or all perpendicular to the copper surface. Also it should be noted that the frequencies are the same (within the experimental resolution) as those of solid benzene22 and of nearly the same width. These features indicate that the benzene interacts only weakly with the copper surface, as would be expected for physisorbed molecules. [Pg.114]

Besides measuring the total thickness of the Cu6Sn5 layer, K.N. Tu and R.D. Thompson also determined the distance from inert markers located in the intermetallic layer to its interfaces with copper and tin (see Fig. 1.12). Discontinuous tungsten stripes deposited onto the copper surface prior to the deposition of tin served as markers. In one series of experiments, the distance, xSni, from the Cu-Cu6Sn5 interface to a tungsten marker was found to be around 60 nm, while the distance, xCu2, from this marker to the Cu6Sn5-Sn interface was equal to 185 nm. Hence,... [Pg.35]

This formalism has been employed [ 118] to address the chemicurrent measured in experiments of the adsorption of hydrogen atoms on copper surfaces [119]. Satisfactory agreement with the experiment has been obtained. However, only one single trajectory of a hydrogen atom impinging on the top site has entered the forced oscillator description so that the effect of corrugation has been entirely neglected. [Pg.21]

The two phase model describes all the principle features of the desorption kinetics, suggesting that recombinative desorption under conditions where the coverage is less than saturation occurs by the recombination of N atoms from a dilute phase on the Cu(l 11) surface. This behaviour is the same as that observed for H recombinative desorption on many surfaces [63]. Desorption from the dilute phase is preferred over direct decomposition of the nitride islands because this leaves the copper surface in its equilibrium (111) orientation, rather than as an unstable Cu(l 00) overlayer [99]. As a result we expect that detailed balance can be used to relate measurements of recombination from the N covered Cu(l 1 1) surface with nitrogen dissociation on bare Cu(l 1 1) terraces. In contrast, if desorption occurred via decomposition of reconstructed copper nitride islands then detailed balance arguments would not reveal anything about the energetics or dynamics of N2 dissociation on a Cu(l 1 1) surface. [Pg.160]

The isosteric heats of adsorption in this study are shown to vary from 2 to 4 kcal./mole. In vivo of the smallness of these values, nitrogen may be considered to be a well-behaved gas for the area measurement of relatively planar nonporous copper surfaces. [Pg.105]

Chinchen GC, et al. The measurement of copper surface-areas by reactive frontal chromatography. J Catal. 1987 103(1) 79—86. [Pg.438]

A ball mill having an inside diameter of 12 ft and an inside length of 14 ft is to be used to grind a copper ore. Measurement shows that the distance between the top of the mill and the leveled surface of the ball charge is 6.35 ft. What is the weight of balls in the mill What is the critical speed of the mill (the speed at which the centrifugal force on a ball in contact with the mill wall at the top of its path equals the force due to gravity) At what percent of critical speed should the mill operate ... [Pg.475]

Profilometer and Contract Angle Measurements The copper surface after Pumice treatment was also examined by profilometry and characterized by contact angle measurement. The profilometer was supplied by Sheffield Measurement Division of Dayton, Ohio. The contact angle measurements were made using a microscope device supplied by Gilmont Instruments, Great Neck, New York. [Pg.282]

Carpio and coworkers [4] supported this hypothesis via a potentiodynamic study of a set of HN03-containing slurries. The corrosion currents and potentials under both the static and the dynamic conditions were practically the same. This is consistent with the fact that there was no native copper oxide film formed because of the presence of these slurries. As a matter of fact, the corrosion currents decreased slightly upon abrasion of the copper surface. The contact between the metal surface and the abrasive pad may have limited the mass transport of chemicals to and from the copper surface. This was verified via an AC impedance measurement that showed the importance of the systems mass transport. It was also concluded that in a dissolution-controlled process, mechanical abrasion would not enhance the chemical corrosion rate or reduce the mass transport of reactants and/or products in the system. [Pg.203]

The adhesion forces of silica and alumina particles in the DI water and slurry solution were measured by AFM and are shown in Fig. 16.27 [66]. The smallest adhesion force, 0.38 nN, was observed between the copper surface and alumina particles in a citric acid solution at pH 6. The largest adhesion force of alumina particles, 5.83 nN, was measured in DI water. [Pg.493]

Unpattemed electroplated copper wafers were polished using an IPEC 472 polisher equipped with an IR temperature sensor which measures pad surface temperature. The copper rate was determined from copper thickness measurements from a Tencor RS55 resistance monitor, calibrated to cross-sectional SEM micrographs. The SEM tools are regularly calibrated to national standards. [Pg.156]


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Copper surface

Measurement surface

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