Copolymers SIMS analysis

D. Briggs. Org. Mass Spectrom. 22, 91, 1987. Static SIMS analysis of copolymers. 

Figure 9 Relative intensities of characteristic negative ion fragments from HEMA-EMA copolymers (see text) plotted as function of bulk composition. Error bars in (A) represent the largest spread of values for any measurement those in (B) and (C) represent the spread of values for all repeated measurements. (Reproduced with permission from Briggs D and Ratner BD (1988) A semi-quantitative SIMS analysis of the surfaces of random ethyl methacrylate hydroxethyl methacrylate copolymer films. Polymer Communications 29 6-8 Butterworths.)...

A brief report of the XPS and SIMS analysis of copolymers of lactic and glycolic acids (PLGA) was made by Davies et al. (1988). Both XPS and SSIMS confirmed that... 

Characterization of the copolymers containing 10 - 30 wt% of silicone macromonomers was done by GPC, DSC, SEM, TEM, surface analysis (SIMS, XPS, contact angle), and especially atomic force microscopy (both Tapping Mode and force modulation mode). 

Surface analysis (XPS, SIMS) of silicone copolymer films as a function of their thickness. Surprisingly, thinner films show a higher relative siloxane concentration at their surface than thicker ones. As expected, the silicon metal concentration measured by secondary ion mass spectrometry is higher because of the lower depth profiled by the method. 

The use of secondary ion mass spectrometry (SIMS) enables surface and interfacial characterization of polymers, copolymers, blends, and composites. Tlme-of-flight secondary ion mass spectrometry (TOF-SIMS) is applied for the investigation of the surface composition of adsorbed layers and molecular conformation of adsorbed block copolymers. Diffusion phenomena, adhesion, and chemical reactions at the interfaces of polymeric materials that need in situ analysis as a function of depth can also be analyzed by SIMS. 

Ruch, D., Boes, C., Zimmer, R., Muller, J.-E, Migeon, H.-N. (2003) Quantitative analysis of styrene butadiene copolymers using S-SIMS and LA-FTICRMS. Applied Surface Science, 203-204, 566-570. 

Brinen, J.S., Rosati, I,., Chakel, J. and Lindley, P. (1993) The effect of polymer architecture on the SIMS spectra of glvcolide / trimethylene carbonate copolymers. Surface and Interface. Analysis, 20, 105.5-1060. Burnham,. kA. and Colton, R.J. (1993) Scanning Tunneling Microscopy and Specuoscopy Theory, Techniques and Applications. Force microscopy, ed. Bonnell D.A., New York, VCl I Publishers Inc. Chen, X., Shakesheff, KM., Davies, M.C., Heller, J., Roberts, C.J., Tendler, S.J.B, and Williams, P.M. (1995) The degradation of a thin polymer film studied by simultaneous in situ atomic force microscopy and surface plasmon resonance analysis. Journal of Physical Chemistry, 11, 2547. 

Leadley, S.R., Davdes, M.C., Domb, A., Nudelman, R., Paul, A.J. and Beamson, G. (in preparation a) The analysis of the surface chemical structure of anhydride copolymers of sebacic acid and ricinoleic acid maleate using XPS and ToF-SIMS. In preparation. 

The application of AFM and other techniques has been discussed in general terms by several workers [350-353]. Other complementary techniques covered in these papers include FT-IR spectroscopy, Raman spectroscopy, NMR spectroscopy, surface analysis by spectroscopy, GC-MS, scanning tunnelling microscopy, electron crystallography, X-ray studies using synchrotron radiation, neutron scattering techniques, mixed crystal infrared spectroscopy, SIMS, and XPS. Applications of atomic force spectroscopy to the characterisation of the following polymers have been reported polythiophene [354], nitrile rubbers [355], perfluoro copolymers of cyclic polyisocyanurates of hexamethylene diisocyanate and isophorone diisocyanate [356], perfluorosulfonate [357], vinyl polymers... 

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