Characterization of Polymer Blends Using SIMS and NanoSIMS

Characterization of Polymer Blends Using SIMS and NanoSIMS [Pg.579]

In this chapter, attention is focused on the surface chemical characterization of polymer blend and, in particular, on their spatially resolved molecular and elemental analysis. [Pg.579]

Although, very often, the lower surface energy component tends to segregate to the surface, a number of other factors - such as solvent, specific interaction and crystallization - can also affect the blend s surface composition [4,5]. Consequently, whilst an understanding of the blend surface composition is of fundamental interest, it may not be easy to acquire. Implied is the simultaneous requirement for chemical speciation at both high lateral and depth resolution within the surface region. [Pg.579]

In this chapter, the application of secondary ion mass spectrometry (SIMS) techniques, and in particular of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and nanoscale secondary ion mass spectrometry (NanoSIMS), to polymer surface characterization is presented, with attention focused especially on polymer blends and interfaces. [Pg.579]

Characteri2Mtion of Polymer Blttuk Miscibility, Morphology, and intafaces. First Edition. [Pg.579]

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