Atomic force microscopy image quality

The use of a quality-factor control device has been demonstrated to increase the resolution image of quartz tuning fork with atomic force microscopy by lowering the quality factor Q of the oscillating probe. By electronically, Q-control has been implemented and used to decrease the quality factor of the quartz tuning fork in air environment. Topographic images of the standard samples were used to demonstrate this technique. 

Atomic Force Microscopy. In addition to SEM, AFM measurements were also performed, to further check the quality of the pattern replication by different stamp materials. Figure 3 illustrates such an experiment. The images nicely demonstrate that, qualitatively, the master patterns were indeed transferred to the stamps. In the case of the PDMS stamp, small defects are visible in the replication of the 100 nm lines. The existence of these discontinuities (similar those observed on the SEM images)... 

---