Atomic force microscopy fabrication method

A simple method for fabrication of bismuth nanoparticles from bulk bismuth by a microwave irradiation is reported. Bismuth nanoparticles of near spherical shape have been characterized by atomic force microscopy (AFM) and transmission electron microscopy (TEM). It is revealed that highly crystalline bismuth nanoparticles have mean diameter of 70 nm. 

The performance of SECM experiments in association with atomic force microscopy (AFM) is typically carried out using a commercial instrument. The concept involves converting the AFM tip into an electrode to operate as the SECM tip, and using the force signal to control its position above the sample surface [127-131]. The tip design (see discussion in Section 12.2.3) is critical and its fabrication technically challenging these points currently limit the take-up of this method. 

Dobson, P. S. Weaver, J. M. R. Burt, D. P et al. 2006. Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes Fabrication method and application to high resolution imaging on heterogeneously active surfaces. Phys. Chem. Chem. Phys. 8 3909-3914. 

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