Atom release kinetic effects

The impact of an ion beam on the electrode surface can result in the transfer of the kinetic energy of the ions to the surface atoms and their release into the vacuum as a wide range of species—atoms, molecules, ions, atomic aggregates (clusters), and molecular fragments. This is the effect of ion sputtering. The SIMS secondary ion mass spectrometry) method deals with the mass spectrometry of sputtered ions. The SIMS method has high analytical sensitivity and, in contrast to other methods of surface analysis, permits a study of isotopes. In materials science, the SIMS method is the third most often used method of surface analysis (after AES and XPS) it has so far been used only rarely in electrochemistry. 

From the technology of combustion we move to the molecular mechanism of flame propagation. We shall give a molecular-kinetic expression for the heat release rate by calculating the frequency v of collisions of fuel molecules with other molecules (v is proportional to the molecular velocity and inversely proportional to the mean free path), further taking into account that only a small (1/j/) part of all collisions are effective. The quantity 1/v—the probability of reaction taken with respect to a single collision— depends on the activation heat of an elementary reaction event, as well as on the fraction of all molecules comprised of those radicals or atoms by means of which the reaction occurs. The molecular-kinetic expression for the coefficient of thermal conductivity follows from formulas (1.2.4) and (1.2.3). 

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